title: Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets.
abstract: The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition, and analysis. Advances in imaging technology in the beginning of the twenty-first century have opened the proverbial floodgates on the availability of high-veracity information on structure and functionality. From the hardware perspective, high-resolution imaging methods now routinely resolve atomic positions with approximately picometer precision, allowing for quantitative measurements of individual bond lengths and angles. Similarly, functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this multidimensional structural and functional data into physically and chemically relevant information.
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Alex
authors.initials: A
authors.lastname: Belianinov
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Rama
authors.initials: R
authors.lastname: Vasudevan
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Evgheni
authors.initials: E
authors.lastname: Strelcov
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Chad
authors.initials: C
authors.lastname: Steed
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 151-747 South Korea ; Department of Physics and Astronomy, Seoul National University, Seoul, 151-747 South Korea.
authors.forename: Sang Mo
authors.initials: SM
authors.lastname: Yang
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Alexander
authors.initials: A
authors.lastname: Tselev
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Stephen
authors.initials: S
authors.lastname: Jesse
authors.affiliation: The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Michael
authors.initials: M
authors.lastname: Biegalski
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; Computer, Computational, and Statistical Sciences, Los Alamos National Laboratory, Los Alamos, NM 87545 USA.
authors.forename: Galen
authors.initials: G
authors.lastname: Shipman
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Christopher
authors.initials: C
authors.lastname: Symons
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Albina
authors.initials: A
authors.lastname: Borisevich
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Rick
authors.initials: R
authors.lastname: Archibald
authors.affiliation: Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA ; The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA.
authors.forename: Sergei
authors.initials: S
authors.lastname: Kalinin
keywords: High-performance computing; Multivariate statistical analysis; Scanning probe microscopy