title: Thoughts about next-generation (S)TEM instruments in science.
abstract: Different aspects of desirable developments in (scanning) transmission electron microscopes are discussed. Topics are the issues with closed data and control channels, the fixed optical design, and the layout of the sample environment. A solution concept to some of these issues on the basis of current technology and already demonstrated concepts is presented and future possibilities in in situ and multi-dimensional microscopy with the new concept are laid out.
authors.affiliation: Speziallabor Triebenberg, Technische Universität Dresden, 01062 Dresden, Germany; IFW Dresden, PF 270116, 01171 Dresden, Germany. Electronic address: felix.boerrnert@uni-ulm.de.
authors.forename: Felix
authors.initials: F
authors.lastname: Börrnert
keywords: Future developments; STEM; TEM