title: Resonant Charge Transport in Conjugated Molecular Wires beyond 10 nm Range.
abstract: Using a scanning tunneling microscope, we measured high-bias conductance of single polyporphyrin molecular wires with lengths from 1.3 to 13 nm. We observed several remarkable transport characteristics, including multiple sharp conductance peaks, conductances as high as 20 nS in wires with lengths of >10 nm, and nearly length-independent conductance (attenuation <0.001 Å(-1)). We carried out first-principles simulations on myriad metal-molecule-metal junctions. The simulations revealed that the measured conductance is coherent resonant transport via a delocalized molecular orbital.
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology , Hong Kong, China.
authors.forename: Guowen
authors.initials: G
authors.lastname: Kuang
authors.affiliation: Department of Applied Physics, School of Physics and Electronics, Hunan University , Changsha 410082, China.
authors.forename: Shi-Zhang
authors.initials: SZ
authors.lastname: Chen
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology , Hong Kong, China.
authors.forename: Weihua
authors.initials: W
authors.lastname: Wang
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology , Hong Kong, China.
authors.forename: Tao
authors.initials: T
authors.lastname: Lin
authors.affiliation: Department of Applied Physics, School of Physics and Electronics, Hunan University , Changsha 410082, China.
authors.forename: Keqiu
authors.initials: K
authors.lastname: Chen
authors.affiliation: Shanghai Key Laboratory of Functional Materials Chemistry and Institute of Fine Chemicals, East China University of Science and Technology , Meilong Road 130, Shanghai 200237, China.
authors.forename: Xuesong
authors.initials: X
authors.lastname: Shang
authors.affiliation: Shanghai Key Laboratory of Functional Materials Chemistry and Institute of Fine Chemicals, East China University of Science and Technology , Meilong Road 130, Shanghai 200237, China.
authors.forename: Pei Nian
authors.initials: PN
authors.lastname: Liu
authors.affiliation: Department of Physics, The Hong Kong University of Science and Technology , Hong Kong, China.
authors.forename: Nian
authors.initials: N
authors.lastname: Lin