title: Biasing vector network analyzers using variable frequency and amplitude signals.
abstract: We report the development of a test setup designed to provide a variable frequency biasing signal to a vector network analyzer (VNA). The test setup is currently used for the testing of liquid crystal (LC) based devices in the microwave region. The use of an AC bias for LC based devices minimizes the negative effects associated with ionic impurities in the media encountered with DC biasing. The test setup utilizes bias tees on the VNA test station to inject the bias signal. The square wave biasing signal is variable from 0.5 to 36.0 V peak-to-peak (VPP) with a frequency range of DC to 10 kHz. The test setup protects the VNA from transient processes, voltage spikes, and high-frequency leakage. Additionally, the signals to the VNA are fused to ½ amp and clipped to a maximum of 36 VPP based on bias tee limitations. This setup allows us to measure S-parameters as a function of both the voltage and the frequency of the applied bias signal.
authors: Center for Magnetism and Magnetic Nanostructures, University of Colorado Colorado Springs, 1420 Austin Bluffs Parkway, Colorado Springs, Colorado 80918, USA.
authors: J E
authors: JE
authors: Nobles
authors: Center for Magnetism and Magnetic Nanostructures, University of Colorado Colorado Springs, 1420 Austin Bluffs Parkway, Colorado Springs, Colorado 80918, USA.
authors: V
authors: V
authors: Zagorodnii
authors: Center for Magnetism and Magnetic Nanostructures, University of Colorado Colorado Springs, 1420 Austin Bluffs Parkway, Colorado Springs, Colorado 80918, USA.
authors: A
authors: A
authors: Hutchison
authors: Center for Magnetism and Magnetic Nanostructures, University of Colorado Colorado Springs, 1420 Austin Bluffs Parkway, Colorado Springs, Colorado 80918, USA.
authors: Z
authors: Z
authors: Celinski