title: An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
abstract: A compact high-speed X-ray atomic force microscope has been developed for in situ use in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: M V
authors: MV
authors: Vitorino
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: Y
authors: Y
authors: Fuchs
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: T
authors: T
authors: Dane
authors: Biosystems and Integrative Sciences Institute (BioISI), Faculdade de Ciências, Universidade de Lisboa, Campo Grande, 1749-016 Lisboa, Portugal.
authors: M S
authors: MS
authors: Rodrigues
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: M
authors: M
authors: Rosenthal
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: A
authors: A
authors: Panzarella
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: P
authors: P
authors: Bernard
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: O
authors: O
authors: Hignette
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: L
authors: L
authors: Dupuy
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: M
authors: M
authors: Burghammer
authors: ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.
authors: L
authors: L
authors: Costa
keywords: in situ atomic force microscopy; radiation damage; semiconducting organic thin films