title: Use of XPS to Quantify Thickness of Coatings on Nanoparticles.
abstract: XPS and other surface sensitive methods are being increasingly used to extract quantitative information about organic and inorganic coatings and contamination on nanoparticles. The extraction of coating thickness requires information about particle diameter from other measurements, such as electron microscopy, combined with a model that includes the physical processes associated with XPS. Advantages of using XPS include the sensitivity to very thin coatings (or surface contamination) and the ability to extract important information about organic layers. Single particle information from electron microsocpy combined with XPS sensitivity in determining composition make a powerful combination for nanoparticle anlaysis.
authors: Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA 99352.
authors: Donald R
authors: DR
authors: Baer
authors: National ESCA & Surface Analysis Center for Biomedical Problems, Department of Bioengineering, Box 351653, University of Washington, Seattle, WA 98195-1653 USA.
authors: Yung-Cheng
authors: YC
authors: Wang
authors: National ESCA & Surface Analysis Center for Biomedical Problems, Department of Bioengineering, Box 351653, University of Washington, Seattle, WA 98195-1653 USA; National ESCA & Surface Analysis Center for Biomedical Problems, Department of Chemical Engineering, Box 351653, University of Washington, Seattle, WA 98195-1653 USA.
authors: David G
authors: DG
authors: Castner