title: The separation of grain and grain boundary impedance in thin yttria stabilized zirconia (YSZ) layers.
abstract: An improved electrode geometry is proposed to study thin ion conducting films by impedance spectroscopy. It is shown that long, thin, and closely spaced electrodes arranged interdigitally allow a separation of grain and grain boundary effects also in very thin films. This separation is shown to be successful for yttria stabilized zirconia (YSZ) layers thinner than 20 nm. In a series of experiments it is demonstrated that the extracted parameters correspond to the YSZ grain boundary and grain bulk resistances or to grain boundary and substrate capacitances. Results also show that our YSZ films produced by pulsed-laser deposition (PLD) on sapphire substrates exhibit a bulk conductivity which is very close to that of macroscopic YSZ samples.
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9-164/EC, 1060 Vienna, Austria.
authors: M
authors: M
authors: Gerstl
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9-164/EC, 1060 Vienna, Austria; Institute of Materials Science, Kaunas University of Technology, Savanoriu 271, 50131 Kaunas, Lithuania.
authors: E
authors: E
authors: Navickas
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9-164/EC, 1060 Vienna, Austria.
authors: G
authors: G
authors: Friedbacher
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9-164/EC, 1060 Vienna, Austria.
authors: F
authors: F
authors: Kubel
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9-164/EC, 1060 Vienna, Austria.
authors: M
authors: M
authors: Ahrens
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9-164/EC, 1060 Vienna, Austria.
authors: J
authors: J
authors: Fleig
keywords: Grain boundaries; Impedance spectroscopy; Ion conduction; Pulsed-laser deposition; Thin films; YSZ