title: Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering.
abstract: Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.
authors: Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252, USA.
authors: Xuan
authors: X
authors: Gao
authors: Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
authors: Diego
authors: D
authors: Casa
authors: Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
authors: Jungho
authors: J
authors: Kim
authors: Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
authors: Thomas
authors: T
authors: Gog
authors: Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252, USA.
authors: Chengyang
authors: C
authors: Li
authors: Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252, USA.
authors: Clement
authors: C
authors: Burns