title: Data on step-by-step atomic force microscopy monitoring of changes occurring in single melanoma cells undergoing ToF SIMS specialized sample preparation protocol.
abstract: Data included in this article are associated with the research article entitled 'Protocol of single cells preparation for time-of-flight secondary ion mass spectrometry' (Bobrowska et al., 2016 in press) [1]. This data file contains topography images of single melanoma cells recorded using atomic force microscopy (AFM). Single cells cultured on glass surface were subjected to the proposed sample preparation protocol applied to prepare biological samples for time-of-flight secondary ion mass spectrometry (ToF SIMS) measurements. AFM images were collected step-by-step for the single cell, after each step of the proposed preparation protocol. It consists of four main parts: (i) paraformaldehyde fixation, (ii) salt removal, (iii) dehydrating, and (iv) sample drying. In total 13 steps are required, starting from imaging of a living cell in a culture medium and ending up at images of a dried cell in the air. The protocol was applied to melanoma cells from two cell lines, namely, WM115 melanoma cells originated from primary melanoma site and WM266-4 ones being the metastasis of WM115 cells to skin.
authors: The Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Cracow, Poland.
authors: J
authors: J
authors: Bobrowska
authors: The Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Cracow, Poland.
authors: J
authors: J
authors: Pabijan
authors: The Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Cracow, Poland.
authors: J
authors: J
authors: Wiltowska-Zuber
authors: Marian Smoluchowski Institute of Physics, Jagiellonian University, Lojasiewicza 11, 30-348 Cracow, Poland.
authors: B R
authors: BR
authors: Jany
authors: Marian Smoluchowski Institute of Physics, Jagiellonian University, Lojasiewicza 11, 30-348 Cracow, Poland.
authors: F
authors: F
authors: Krok
authors: Marian Smoluchowski Institute of Physics, Jagiellonian University, Lojasiewicza 11, 30-348 Cracow, Poland.
authors: K
authors: K
authors: Awsiuk
authors: Marian Smoluchowski Institute of Physics, Jagiellonian University, Lojasiewicza 11, 30-348 Cracow, Poland.
authors: J
authors: J
authors: Rysz
authors: Marian Smoluchowski Institute of Physics, Jagiellonian University, Lojasiewicza 11, 30-348 Cracow, Poland.
authors: A
authors: A
authors: Budkowski
authors: The Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Cracow, Poland.
authors: M
authors: M
authors: Lekka
keywords: AFM imaging; Single cells preparation; ToF SIMS