title: Electrochemical properties of La0.6Sr0.4CoO3 - δthin films investigated by complementary impedance spectroscopy and isotope exchange depth profiling.
abstract: The oxygen exchange and diffusion properties of La0.6Sr0.4CoO3 - δthin films on yttria stabilized zirconia were analyzed by impedance spectroscopy and18O tracer experiments. The investigations were performed on the same thin film samples and at the same temperature (400 °C) in order to get complementary information by the two methods. Electrochemical impedance spectroscopy can reveal resistive and capacitive contributions of such systems, but an exact interpretation of the spectra of complex oxide electrodes is often difficult from impedance data alone. It is shown that additional isotope exchange depth profiling can significantly help interpreting impedance spectra by giving reliable information on the individual contribution and exact location of resistances (surface, electrode bulk, interface). The measurements also allowed quantitative comparison of electrode polarization resistances obtained by different methods.
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9, A-1060 Vienna, Austria.
authors: Markus
authors: M
authors: Kubicek
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9, A-1060 Vienna, Austria.
authors: Tobias M
authors: TM
authors: Huber
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9, A-1060 Vienna, Austria.
authors: Andreas
authors: A
authors: Welzl
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9, A-1060 Vienna, Austria; University Service Center for Transmission Electron Microscopy, Vienna University of Technology, Wiedner Hauptstr. 8-10, A-1040 Vienna, Austria.
authors: Alexander
authors: A
authors: Penn
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9, A-1060 Vienna, Austria.
authors: Ghislain M
authors: GM
authors: Rupp
authors: University Service Center for Transmission Electron Microscopy, Vienna University of Technology, Wiedner Hauptstr. 8-10, A-1040 Vienna, Austria.
authors: Johannes
authors: J
authors: Bernardi
authors: University Service Center for Transmission Electron Microscopy, Vienna University of Technology, Wiedner Hauptstr. 8-10, A-1040 Vienna, Austria.
authors: Michael
authors: M
authors: Stöger-Pollach
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9, A-1060 Vienna, Austria.
authors: Herbert
authors: H
authors: Hutter
authors: Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9, A-1060 Vienna, Austria.
authors: Jürgen
authors: J
authors: Fleig
keywords: Diffusion; Impedance spectroscopy; Isotope exchange; Mixed conductor; Surface exchange; ToF-SIMS