title: Current status and future directions for in situ transmission electron microscopy.
abstract: This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.
authors: Department of Materials Science and Engineering, Drexel University, USA.
authors: Mitra L
authors: ML
authors: Taheri
authors: Center for Functional Nanomaterials, National Laboratory, Brookhaven, USA.
authors: Eric A
authors: EA
authors: Stach
authors: Pacific Northwest National Laboratory, Physical and Computational Sciences Directorate, 902 Battelle Blvd, Richland, WA, USA.
authors: Ilke
authors: I
authors: Arslan
authors: School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85281, USA.
authors: P A
authors: PA
authors: Crozier
authors: The Pennsylvania State University, University Park, PA 16802, USA.
authors: Bernd C
authors: BC
authors: Kabius
authors: Lawrence Livermore National Laboratory, Physical and Life Science Directorate, Condensed Matter and Materials Division, 7000 East Avenue, P.O. 808 L-356, USA.
authors: Thomas
authors: T
authors: LaGrange
authors: Department of Materials Science & Engineering, University of California, Berkeley and National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, One Cyclotron Road, MS 72, Berkeley, CA, USA.
authors: Andrew M
authors: AM
authors: Minor
authors: Institute of Scientific and Industrial Research (ISIR), Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
authors: Seiji
authors: S
authors: Takeda
authors: Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203, USA.
authors: Mihaela
authors: M
authors: Tanase
authors: Center for Electron Nanoscopy, Technical University of Denmark, Kgs, Lyngby, Denmark.
authors: Jakob B
authors: JB
authors: Wagner
authors: Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203, USA. Electronic address: renu.sharma@nist.gov.
authors: Renu
authors: R
authors: Sharma
keywords: DTEM; Direct electron detectors; ETEM; Gas/liquid-solid interactions; Heating holder; In situ TEM; Indentation holder; Liquid/gas cell holder; Phase transformation; Structure property relationship