Effect of sulfurization time on the properties of copper zinc tin sulfide thin films grown by electrochemical deposition.
We report growth of quaternary Cu2 ZnSnS4 (CZTS) thin films prepared by the electrochemical deposition from salt precursors containing Cu (II), Zn (II) and Sn (IV) metals. The influence of different sulfurization times t (t = 75, 90, 105, and 120 min) on the structural, compositional, morphological, and optical properties, as well as on the electrical properties is studied. The films sulfurized 2 hours showed a prominent kesterite phase with a nearly stoichiometric composition. Samples were characterized by X-ray diffraction (XRD), field-emission scanning electron microscopy (FESEM), and Raman and UV-VIS-NIR spectrometer at different stages of work. X-ray diffraction and Raman spectroscopy analyses confirmed the formation of phase-pure CZTS films. (FESEM) shows that compact and dense morphology and enhanced photo-sensitivity. STEM - EDS elemental map of CZTS cross-section confirms homogeneous distribution. From optical study, energy gap was enlarged with a changed sulfurization times in the range of 1.37-1.47 eV.
King Abdullah Institute for Nanotechnology, King Saud University, Riyadh 11451, Saudi Arabia.
Ali
A
Aldalbahi
Nano- Optoelectronic Laboratory, Institute of Engineering Research and Materials Technology (IERMT), National Center for Research, Khartoum- Sudan.
E M
EM
Mkawi
Nano-Optoelectronics Research and Technology Laboratory, School of Physics Universiti Sains Malaysia, 11800 Penang, Malaysia.
K
K
Ibrahim
Department of Chemistry, GC University Lahore, 54000 Lahore, Pakistan.
M A
MA
Farrukh