Environmental Instability and Degradation of Single- and Few-Layer WTe2Nanosheets in Ambient Conditions.
The ambient environmental instability and degradation mechanism of single- and few-layer WTe2are investigated. Oxidation of W and Te atoms appears to be a main reason for degradation. Single-layer samples' Raman signals disappear within 20 min in air. Few-layer WTe2exhibits saturating degradation behavior: only the top layer WTe2is oxidized; the degraded layer can protect inner layers from further degradation.
Department of Electrical Engineering & Computer Science, Case School of Engineering, Case Western Reserve University, 10900 Euclid Avenue, Cleveland, OH, 44106, USA.
Fan
F
Ye
Department of Electrical Engineering & Computer Science, Case School of Engineering, Case Western Reserve University, 10900 Euclid Avenue, Cleveland, OH, 44106, USA.
Jaesung
J
Lee
Department of Physics and Engineering Physics, Tulane University, New Orleans, LA, 70118, USA.
Jin
J
Hu
Department of Physics and Engineering Physics, Tulane University, New Orleans, LA, 70118, USA.
Zhiqiang
Z
Mao
Department of Physics and Engineering Physics, Tulane University, New Orleans, LA, 70118, USA.
Jiang
J
Wei
Department of Electrical Engineering & Computer Science, Case School of Engineering, Case Western Reserve University, 10900 Euclid Avenue, Cleveland, OH, 44106, USA.
Philip X-L
PX
Feng
2D semiconductors; AES; Raman; degradation; nanosheets; tungsten ditelluride (WTe2)