title: Resolution criteria in double-slit microscopic imaging experiments.
abstract: Double-slit imaging is widely used for verifying the resolution of high-resolution and super-resolution microscopies. However, due to the fabrication limits, the slit width is generally non-negligible, which can affect the claimed resolution. In this paper we theoretically calculate the electromagnetic field distribution inside and near the metallic double slit using waveguide mode expansion method, and acquire the far-field image by vectorial Fourier optics. We find that the slit width has minimal influence when the illuminating light is polarized parallel to the slits. In this case, the claimed resolution should be based on the center-to-center distance of the double-slit.
authors.affiliation: Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371, Singapore.|State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China.
authors.forename: Shangting
authors.initials: S
authors.lastname: You
authors.affiliation: State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China.
authors.forename: Cuifang
authors.initials: C
authors.lastname: Kuang
authors.affiliation: Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371, Singapore.|Centre for Disruptive Photonic Technologies, Nanyang Technological University, 637371, Singapore.
authors.forename: Baile
authors.initials: B
authors.lastname: Zhang