title: Morphological and optical data of AgNW embedded transparent conductive layer.
abstract: In this data article, morphological and optical data of AgNW encapsulated between ITO layers are presented to get insights into our article (DOI:10.1016/j.solmat.2016.04.038; Hong-Sik Kim, Pankaj Yadav, Malkeshkumar Patel, Hyunki Kim, Kavita Pandey, Joondong Kim, 2016) [1]. SEM images for the formation of AgNWs networks by number of spin coating are also presented. SEM photographs showing the surface morphologies before and after rapid thermal treatment of prepared samples have been presented. Apart from morphological data set, optical characteristics of this type of samples are given. The comparison plots of optical reflectance from AgNW encapsulated between ITO layers and bare ITO are given between the wavelength ranges from 300 to 1100 nm. At the end, transmittance and reflectance curves of native glass substrates used in this study are presented.
authors.affiliation: Photoelectric and Energy Device Applications Lab (PEDAL) and Department of Electrical Engineering, Incheon National University, 119 Academy Rd. Yeonsu, Incheon 406772, Korea.
authors.forename: Hong-Sik
authors.initials: HS
authors.lastname: Kim
authors.affiliation: Photoelectric and Energy Device Applications Lab (PEDAL) and Department of Electrical Engineering, Incheon National University, 119 Academy Rd. Yeonsu, Incheon 406772, Korea.
authors.forename: Dipal B
authors.initials: DB
authors.lastname: Patel
authors.affiliation: Photoelectric and Energy Device Applications Lab (PEDAL) and Department of Electrical Engineering, Incheon National University, 119 Academy Rd. Yeonsu, Incheon 406772, Korea.
authors.forename: Malkeshkumar
authors.initials: M
authors.lastname: Patel
authors.affiliation: Photoelectric and Energy Device Applications Lab (PEDAL) and Department of Electrical Engineering, Incheon National University, 119 Academy Rd. Yeonsu, Incheon 406772, Korea.
authors.forename: Joondong
authors.initials: J
authors.lastname: Kim
keywords: AgNWs; ITO thin films; Optical properties; Thermal processing