Two-step phase-shifting SPIDER.
Comprehensive characterization of ultrafast optical field is critical for ultrashort pulse generation and its application. This paper combines two-step phase-shifting (TSPS) into the spectral phase interferometry for direct electric-field reconstruction (SPIDER) to improve the reconstruction of ultrafast optical-fields. This novel SPIDER can remove experimentally the dc portion occurring in traditional SPIDER method by recording two spectral interferograms with π phase-shifting. As a result, the reconstructed results are much less disturbed by the time delay between the test pulse replicas and the temporal widths of the filter window, thus more reliable. What is more, this SPIDER can work efficiently even the time delay is so small or the measured bandwidth is so narrow that strong overlap happens between the dc and ac portions, which allows it to be able to characterize the test pulses with complicated temporal/spectral structures or narrow bandwidths.
Shenzhen Key Lab of Micro-Nano Photonic Information Technology, College of Electronic Science and Technology, Shenzhen University, Shenzhen, Guangdong 518060, People's Republic of China.
Shuiqin
S
Zheng
Shenzhen Key Lab of Micro-Nano Photonic Information Technology, College of Electronic Science and Technology, Shenzhen University, Shenzhen, Guangdong 518060, People's Republic of China.
Yi
Y
Cai
Shenzhen Key Lab of Micro-Nano Photonic Information Technology, College of Electronic Science and Technology, Shenzhen University, Shenzhen, Guangdong 518060, People's Republic of China.
Xinjian
X
Pan
Shenzhen Key Lab of Micro-Nano Photonic Information Technology, College of Electronic Science and Technology, Shenzhen University, Shenzhen, Guangdong 518060, People's Republic of China.
Xuanke
X
Zeng
Shenzhen Key Lab of Micro-Nano Photonic Information Technology, College of Electronic Science and Technology, Shenzhen University, Shenzhen, Guangdong 518060, People's Republic of China.
Jingzhen
J
Li
SZU-NUS Collaborative Innovation Center for Optoelectronic Science &Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Guangdong 518060, P. R. China.
Ying
Y
Li
Shenzhen Key Lab of Micro-Nano Photonic Information Technology, College of Electronic Science and Technology, Shenzhen University, Shenzhen, Guangdong 518060, People's Republic of China.
Tianlong
T
Zhu
Shenzhen Key Lab of Micro-Nano Photonic Information Technology, College of Electronic Science and Technology, Shenzhen University, Shenzhen, Guangdong 518060, People's Republic of China.
Qinggang
Q
Lin
Shenzhen Key Lab of Micro-Nano Photonic Information Technology, College of Electronic Science and Technology, Shenzhen University, Shenzhen, Guangdong 518060, People's Republic of China.
Shixiang
S
Xu
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