Metrology with PT-Symmetric Cavities: Enhanced Sensitivity near the PT-Phase Transition.
We propose and analyze a new approach based on parity-time (PT) symmetric microcavities with balanced gain and loss to enhance the performance of cavity-assisted metrology. We identify the conditions under which PT-symmetric microcavities allow us to improve sensitivity beyond what is achievable in loss-only systems. We discuss the application of PT-symmetric microcavities to the detection of mechanical motion, and show that the sensitivity is significantly enhanced near the transition point from unbroken- to broken-PT regimes. Our results open a new direction for PT-symmetric physical systems and it may find use in ultrahigh precision metrology and sensing.
Department of Automation, Tsinghua University, Beijing 100084, China.|Tsinghua National Laboratory for Information Science and Technology, Beijing 100084, China.
Zhong-Peng
ZP
Liu
Department of Automation, Tsinghua University, Beijing 100084, China.|Tsinghua National Laboratory for Information Science and Technology, Beijing 100084, China.|Department of Electrical and Systems Engineering, Washington University, St. Louis, Missouri 63130, USA.
Jing
J
Zhang
Department of Electrical and Systems Engineering, Washington University, St. Louis, Missouri 63130, USA.
Şahin Kaya
ŞK
Özdemir
Department of Electrical and Systems Engineering, Washington University, St. Louis, Missouri 63130, USA.
Bo
B
Peng
CEMS, RIKEN, Saitama 351-0198, Japan.|Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, Department of Physics and Synergetic Innovation Center for Quantum Effects and Applications, Hunan Normal University, Changsha 410081, China.
Hui
H
Jing
CEMS, RIKEN, Saitama 351-0198, Japan.|School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.
Xin-You
XY
Lü
Department of Automation, Tsinghua University, Beijing 100084, China.|Tsinghua National Laboratory for Information Science and Technology, Beijing 100084, China.
Chun-Wen
CW
Li
Department of Electrical and Systems Engineering, Washington University, St. Louis, Missouri 63130, USA.
Lan
L
Yang
CEMS, RIKEN, Saitama 351-0198, Japan.|Physics Department, The University of Michigan, Ann Arbor, Michigan 48109, USA.
Franco
F
Nori
Tsinghua National Laboratory for Information Science and Technology, Beijing 100084, China.|Institute of Microelectronics, Tsinghua University, Beijing 100084, China.
Yu-Xi
YX
Liu