Identification of Nanocrystalline Inclusions in Bismuth-Doped Silica Fibers and Preforms.
The nature of nanocrystalline inclusions and dopant distribution in bismuth-doped silicate fibers and preforms are studied by scanning and transmission electron microscopy, and energy and wavelength-dispersive X-ray microanalysis. The core compositions are Bi:SiO2, Bi:Al2O3-SiO2, Bi:GeO2-SiO2, Bi:Al2O3-GeO2-SiO2, and Bi:P2O5-Al2O3-GeO2-SiO2. Nanocrystals of metallic Bi, Bi2O3, SiO2, GeO2, and Bi4(GeO4)3 are observed in these glasses. These inclusions can be the reason for the background optical loss in bismuth-doped optical fibers. The bismuth concentration of 0.0048±0.0006 at% is directly measured in aluminosilicate optical fibers with effective laser generation (slope efficiency of 27% at room temperature).
1Fiber Optics Research Center,Russian Academy of Sciences,38 Vavilov Street,119333 Moscow,Russia.
Liudmila D
LD
Iskhakova
1Fiber Optics Research Center,Russian Academy of Sciences,38 Vavilov Street,119333 Moscow,Russia.
Filipp O
FO
Milovich
1Fiber Optics Research Center,Russian Academy of Sciences,38 Vavilov Street,119333 Moscow,Russia.
Valery M
VM
Mashinsky
1Fiber Optics Research Center,Russian Academy of Sciences,38 Vavilov Street,119333 Moscow,Russia.
Alexander S
AS
Zlenko
3Institute of Geology of Ore Deposits, Petrography, Mineralogy and Geochemistry,Russian Academy of Sciences,35 Staromonetniy per.,119027 Moscow,Russia.
Sergey E
SE
Borisovsky
1Fiber Optics Research Center,Russian Academy of Sciences,38 Vavilov Street,119333 Moscow,Russia.
Evgeny M
EM
Dianov
bismuth; microprobe analysis; nanocrystalline inclusions; optical fiber; transmission electron microscopy