Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images.
Serial block-face scanning electron microscopy (SBEM) is quickly becoming an important imaging tool to explore three-dimensional biological structure across spatial scales. At probe-beam-electron energies of 2.0 keV or lower, the axial resolution should improve, because there is less primary electron penetration into the block face. More specifically, at these lower energies, the interaction volume is much smaller, and therefore, surface detail is more highly resolved. However, the backscattered electron yield for metal contrast agents and the backscattered electron detector sensitivity are both sub-optimal at these lower energies, thus negating the gain in axial resolution. We found that the application of a negative voltage (reversal potential) applied to a modified SBEM stage creates a tunable electric field at the sample. This field can be used to decrease the probe-beam-landing energy and, at the same time, alter the trajectory of the signal to increase the signal collected by the detector. With decelerated low landing-energy electrons, we observed that the probe-beam-electron-penetration depth was reduced to less than 30 nm in epoxy-embedded biological specimens. Concurrently, a large increase in recorded signal occurred due to the re-acceleration of BSEs in the bias field towards the objective pole piece where the detector is located. By tuning the bias field, we were able to manipulate the trajectories of the  primary and secondary electrons, enabling the spatial discrimination of these signals using an advanced ring-type BSE detector configuration or a standard monolithic BSE detector coupled with a blocking aperture.
National Center for Microscopy and Imaging Research, University of California at San Diego, BSB 1000, 9500 Gilman Dr., La Jolla, CA 92093-0608 USA.
James C
JC
Bouwer
National Center for Microscopy and Imaging Research, University of California at San Diego, BSB 1000, 9500 Gilman Dr., La Jolla, CA 92093-0608 USA.
Thomas J
TJ
Deerinck
National Center for Microscopy and Imaging Research, University of California at San Diego, BSB 1000, 9500 Gilman Dr., La Jolla, CA 92093-0608 USA.
Eric
E
Bushong
National Center for Microscopy and Imaging Research, University of California at San Diego, BSB 1000, 9500 Gilman Dr., La Jolla, CA 92093-0608 USA.
Vadim
V
Astakhov
National Center for Microscopy and Imaging Research, University of California at San Diego, BSB 1000, 9500 Gilman Dr., La Jolla, CA 92093-0608 USA.
Ranjan
R
Ramachandra
National Center for Microscopy and Imaging Research, University of California at San Diego, BSB 1000, 9500 Gilman Dr., La Jolla, CA 92093-0608 USA.
Steven T
ST
Peltier
National Center for Microscopy and Imaging Research, University of California at San Diego, BSB 1000, 9500 Gilman Dr., La Jolla, CA 92093-0608 USA.
Mark H
MH
Ellisman
Backscatter electron detector; Cerebellum; Deceleration; SBEM; SEM; Serial section; Volume reconstruction
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