Big, Deep, and Smart Data in Scanning Probe Microscopy.
Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.
Sergei V
SV
Kalinin
Evgheni
E
Strelcov
Alex
A
Belianinov
Suhas
S
Somnath
Rama K
RK
Vasudevan
Eric J
EJ
Lingerfelt
Richard K
RK
Archibald
College of Computing and Informatics, Drexel University , Philadelphia, Pennsylvania 19104, United States.
Chaomei
C
Chen
Asylum Research, an Oxford Instruments Company , Santa Barbara, California 93117, United States.
Roger
R
Proksch
Nouamane
N
Laanait
Stephen
S
Jesse