title: Toxicity assessment and feasible recycling process for amorphous silicon and CIS waste photovoltaic panels.
abstract: End-of-Life (EoL) photovoltaic (P/V) modules, which are recently included in the 2012/19/EU recast, require sound and sustainable treatment. Under this perspective, this paper deals with 2nd generation P/V waste modules, known as thin-film, via applying chemical treatment techniques. Two different types of modules are examined: (i) tandem a-Si:H/μc-Si:H panel and, (ii) Copper-Indium-Selenide (CIS) panel. Panels' pretreatment includes collection, manual dismantling and shredding; pulverization and digestion are further conducted to identify their chemical composition. A variety of elements is determined in the samples leachates' after both microwave-assisted total digestion and Toxicity Characteristic Leaching Procedure (TCLP test) using Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) analysis. The analysis reveals that several elements are detected in the two of panels, with no sample exceeds the TCLP test. Concentrations of precious and critical metals are also measured, which generates great incentives for recovery. Then, further experiments, for P/V recycling investigation, are presented using different acids or acid mixtures under a variety of temperatures and a stable S/L ratio, with or without agitation, in order to determine the optimal recycling conditions. The results verify that chemical treatment in P/V shredded samples is efficient since driving to ethylene-vinyl acetate (EVA) resin's dissolution, as well as valuable structural materials recovery (P/V glass, ribbons, cells, P/V intermediate layers). Among the solvents used, sulfuric acid and lactic acid demonstrate the most efficient and strongest performance on panels' treatment at gentle temperatures providing favorably low energy requirements.
authors.affiliation: School of Environmental Engineering, Technical University of Crete, Politechnioupolis, Chania 73100, Greece. Electronic address: vsavvilotidou@hotmail.com.
authors.forename: Vasiliki
authors.initials: V
authors.lastname: Savvilotidou
authors.affiliation: School of Environmental Engineering, Technical University of Crete, Politechnioupolis, Chania 73100, Greece.
authors.forename: Alexandra
authors.initials: A
authors.lastname: Antoniou
authors.affiliation: School of Environmental Engineering, Technical University of Crete, Politechnioupolis, Chania 73100, Greece. Electronic address: gidarako@mred.tuc.gr.
authors.forename: Evangelos
authors.initials: E
authors.lastname: Gidarakos
mesh_terms: D003300:Copper / Q000032:analysis; D059029:Electronic Waste / Q000032:analysis*; D005898:Glass; D007204:Indium / Q000032:analysis; D019344:Lactic Acid / Q000737:chemistry; D059027:Recycling / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D013464:Sulfuric Acids / Q000737:chemistry; D013696:Temperature; D018505:Waste Management / Q000379:methods*
chemical_list: D013464:Sulfuric Acids; D007204:Indium; D019344:Lactic Acid; D003300:Copper; C033158:sulfuric acid; D012825:Silicon
keywords: Critical metals; EVA’s dissolution; Indium; P/V recycling; Thin-film toxicity