title: KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires.
abstract: A mapping technique has been developed where a sub-micrometer focused polychromatic X-ray beam is scanned across a stationary sample instead of scanning the sample in front of the X-ray microbeam. This method is applied to a gold nanowire during its mechanical loading using the tip of an atomic force microscope. During the loading process, such a sample is `accelero-phobic', i.e. the sample scanning stages must not to be moved to avoid parasitic additional load. Without beam scanning, only one single position within the sample can be probed during the test. The probed material point may even change because of drifts or movements induced by the test itself. The new scanning approach facilitates the in situ mapping of the entire wire giving access to the evolution of the wire shape as well as to the boundary conditions. This novel scanning technique opens promising perspectives for studies where sample motion is forbidden because of the sample environment.
authors: Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors: C
authors: C
authors: Leclere
authors: Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors: T W
authors: TW
authors: Cornelius
authors: Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors: Z
authors: Z
authors: Ren
authors: CRG-IF BM32 Beamline at the European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France.
authors: O
authors: O
authors: Robach
authors: CRG-IF BM32 Beamline at the European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France.
authors: J S
authors: JS
authors: Micha
authors: Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors: A
authors: A
authors: Davydok
authors: CRG-IF BM32 Beamline at the European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France.
authors: O
authors: O
authors: Ulrich
authors: Max Planck Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart, Germany.
authors: G
authors: G
authors: Richter
authors: Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors: O
authors: O
authors: Thomas
keywords: Laue microdiffraction; atomic force microscope; in situ mechanical test; nanowire