title: Micrometer-resolution imaging using MÖNCH: towards G2-less grating interferometry.
abstract: MÖNCH is a 25 µm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor, e.g. inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 µm. In this work, the characterization results of one of the MÖNCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G2are shown and discussed. Perspectives for the future developments of the MÖNCH detector are also presented.
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Sebastian
authors: S
authors: Cartier
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Matias
authors: M
authors: Kagias
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Anna
authors: A
authors: Bergamaschi
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Zhentian
authors: Z
authors: Wang
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Roberto
authors: R
authors: Dinapoli
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Aldo
authors: A
authors: Mozzanica
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Marco
authors: M
authors: Ramilli
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Bernd
authors: B
authors: Schmitt
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Martin
authors: M
authors: Brückner
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Erik
authors: E
authors: Fröjdh
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Dominic
authors: D
authors: Greiffenberg
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Davit
authors: D
authors: Mayilyan
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Davide
authors: D
authors: Mezza
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Sophie
authors: S
authors: Redford
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Christian
authors: C
authors: Ruder
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Lukas
authors: L
authors: Schädler
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Xintian
authors: X
authors: Shi
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Dhanya
authors: D
authors: Thattil
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Gemma
authors: G
authors: Tinti
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Jiaguo
authors: J
authors: Zhang
authors: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors: Marco
authors: M
authors: Stampanoni
keywords: grating interferometry; hybrid detectors; interpolation; silicon detectors