title: Some Remarks on Applications of Tests for Detecting A Change Point to Psychometric Problems.
abstract: Tests for a change point (e.g., Chen and Gupta, Parametric statistical change point analysis (2nd ed.). Birkhuser, Boston, 2012; Hawkins et al., J Qual Technol 35:355-366, 2003) have recently been brought into the spotlight for their potential uses in psychometrics. They have been successfully applied to detect an unusual change in the mean score of a sequence of administrations of an international language assessment (Lee and von Davier, Psychometrika 78:557-575, 2013) and to detect speededness of examinees (Shao et al., Psychometrika, 2015). The differences in the type of data used, the test statistics, and the manner in which the critical values were obtained in these papers lead to questions such as "what type of psychometric problems can be solved by tests for a change point?" and "what test statistics should be used with tests for a change point in psychometric problems?" This note attempts to answer some of these questions by providing a general overview of tests for a change point with a focus on application to psychometric problems. A discussion is provided on the choice of an appropriate test statistic and on the computation of a corresponding critical value for tests for a change point. Then, three real data examples are provided to demonstrate how tests for a change point can be used to make important inferences in psychometric problems. The examples include some clarifications and remarks on the critical values used in Lee and von Davier (Psychometrika, 78:557-575, 2013) and Shao et al. (Psychometrika, 2015). The overview and the examples provide insight on tests for a change point above and beyond Lee and von Davier (Psychometrika, 78:557-575, 2013) and Shao et al. (Psychometrika, 2015). Thus, this note extends the research of Lee and von Davier (Psychometrika, 78:557-575, 2013) and Shao et al. (Psychometrika, 2015) on tests for a change point.
authors: Pacific Metrics Corporation, Princeton, NJ, USA. ssinharay@ets.org.|Educational Testing Service, Princeton, NJ, USA. ssinharay@ets.org.
authors: Sandip
authors: 0000-0003-4491-8510
authors: S
authors: Sinharay
mesh_terms: D003627:Data Interpretation, Statistical; D004521:Educational Measurement; D006801:Humans; D011594:Psychometrics / Q000379:methods*
keywords: likelihood ratio test; statistical process control; statistical quality control