title: Mapping for total surface-enhanced Raman scattering to improve its quantification analysis.
abstract: Surface-enhanced Raman scattering (SERS) has been applied in a range of fields for its super high sensitivity which can even reach the single molecule level. But the quantification methods based on SERS still have some challenges such as stability, repeatability, and linearity at low concentrations. Here we propose a new quantification approach by using a total mapping scheme, and then add all the spectra together to obtain a final merged spectrum (a total SERS spectrum). The total SERS spectra were used to perform quantification analysis. The results of this approach show that it can improve the signal stability by at least 50% (RSD) and extend the linear quantification range by one order of magnitude. The proposed total SERS mapping quantification strategy is a promising practical working mode to improve its analytical figures of merit.
authors: Analytical & Testing Centre, Sichuan University, Chengdu, Sichuan 610064 China.
authors: Yunfei
authors: Y
authors: Tian
authors: Analytical & Testing Centre, Sichuan University, Chengdu, Sichuan 610064 China.
authors: Peng
authors: P
authors: Wu
authors: Analytical & Testing Centre, Sichuan University, Chengdu, Sichuan 610064 China.
authors: Qin
authors: Q
authors: Liu
authors: Analytical & Testing Centre, Sichuan University, Chengdu, Sichuan 610064 China. Electronic address: wuxi3@163.com.
authors: Xi
authors: X
authors: Wu
authors: Analytical & Testing Centre, Sichuan University, Chengdu, Sichuan 610064 China; College of Chemistry, Sichuan University, Chengdu, Sichuan 610064 China. Electronic address: houxd@scu.edu.cn.
authors: Xiandeng
authors: X
authors: Hou
keywords: Mapping analysis; Quantification; Raman; Sampling method; Surface-enhanced Raman scattering