Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2-3, 1995.
Precision Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
John A
JA
Dagata
SEMATECH, 2703 Montopolis Road, Austin, TX 78714.
Alain C
AC
Diebold
Department of Physics, University of Texas, RLM 5.208, Austin, TX 78712.
C K
CK
Ken Shih
Code 6177 Naval Research Laboratory, Washington, DC 20375.
Richard J
RJ
Colton