A Low-loss Metasurface Antireflection Coating on Dispersive Surface Plasmon Structure.
Over the years, there has been increasing interest in the integration of metal hole array (MHA) with optoelectronic devices, as a result of enhanced coupling of incident light into the active layer of devices via surface plasmon polariton (SPP) resonances. However, not all incident light contributes to the SPP resonances due to significant reflection loss at the interface between incident medium and MHA. Conventional thin-film antireflection (AR) coating typically does not work well due to non-existing material satisfying the AR condition with strong dispersion of MHA's effective impedances. We demonstrate a single-layer metasurface AR coating that completely eliminates the refection and significantly increases the transmission at the SPP resonances. Operating at off-resonance wavelengths, the metasurface exhibits extremely low loss and does not show resonant coupling with the MHA layer. The SPP resonance wavelengths of MHA layer are unaffected whereas the surface wave is significantly increased, thereby paving the way for improved performance of optoelectronic devices. With an improved retrieval method, the metasurface is proved to exhibit a high effective permittivity () and extremely low loss (tan δ ~ 0.005). A classical thin-film AR coating mechanism is identified through analytical derivations and numerical simulations.
Division of Convergence Technology, Korea Research Institute of Standards and Science, Daejeon, 305-340, Korea.|Department of Electrical Engineering, Sejong University, Seoul 143-747, Korea.
Jiyeon
J
Jeon
Department of Physics, University of South Florida, Tampa, 33620, USA.
Khagendra
K
Bhattarai
Department of Electrical Engineering, Sejong University, Seoul 143-747, Korea.
Deok-Kee
DK
Kim
Division of Convergence Technology, Korea Research Institute of Standards and Science, Daejeon, 305-340, Korea.
Jun Oh
JO
Kim
Air Force Research Laboratory, Materials Directorate, Wright-Patterson AFB, 45433, USA.
Augustine
A
Urbas
Division of Convergence Technology, Korea Research Institute of Standards and Science, Daejeon, 305-340, Korea.
Sang Jun
SJ
Lee
Air Force Research Laboratory, Materials Directorate, Wright-Patterson AFB, 45433, USA.
Zahyun
Z
Ku
Department of Physics, University of South Florida, Tampa, 33620, USA.
Jiangfeng
J
Zhou