Dual-comb spectroscopy for rapid characterization of complex optical properties of solids.
We demonstrate rapid characterization of complex optical properties of solids via dual-comb spectroscopy (DCS) in the near-infrared region. The fine spectral structures in the complex refractive index of an Er:YAG are successfully deduced using the developed system and Fourier analysis. Moreover, simultaneous determination of the refractive index and the thickness is demonstrated for a silicon semiconductor wafer through the use of multireflected echo signals. The results indicate the potential of DCS as a powerful measurement tool for the rapid and full characterization of solid materials.
Akifumi
A
Asahara
Akiko
A
Nishiyama
Satoru
S
Yoshida
Ken-Ichi
KI
Kondo
Yoshiaki
Y
Nakajima
Kaoru
K
Minoshima