title: A precise measurement of the117mSn half-life.
abstract: The117mSn isotope was produced via fast, 14.1MeV neutron activation of natural tin and studied with a background shielded HPGe detector. To enable time-resolved γ-ray spectroscopy to precisely measure the half-life of117mSn, a commercial DAQ was replaced with a CAMAC-based analogue DAQ. The deadtime response of the applied DAQ was verified for the measurement. The half-life of117mSn was measured to be 13.91±0.03 days and the I(158.6keV)/I(156.0keV) γ-ray ratio was measured to be 43.6±1.5.
authors.affiliation: Simon Fraser University, Burnaby, BC, Canada, V5A 1S6. Electronic address: tdomingo@sfu.ca.
authors.forename: T
authors.initials: T
authors.lastname: Domingo
authors.affiliation: Simon Fraser University, Burnaby, BC, Canada, V5A 1S6. Electronic address: starosta@sfu.ca.
authors.forename: K
authors.initials: K
authors.lastname: Starosta
authors.affiliation: Simon Fraser University, Burnaby, BC, Canada, V5A 1S6.
authors.forename: A
authors.initials: A
authors.lastname: Chester
authors.affiliation: Simon Fraser University, Burnaby, BC, Canada, V5A 1S6.
authors.forename: J
authors.initials: J
authors.lastname: Williams
keywords: (117m)Sn; Deadtime verification; HPGe low-background counting; Half-life; Neutron activation; Time-resolved gamma-ray spectroscopy