title: Sensor for In-Motion Continuous 3D Shape Measurement Based on Dual Line-Scan Cameras.
abstract: The acquisition of three-dimensional surface data plays an increasingly important role in the industrial sector. Numerous 3D shape measurement techniques have been developed. However, there are still limitations and challenges in fast measurement of large-scale objects or high-speed moving objects. The innovative line scan technology opens up new potentialities owing to the ultra-high resolution and line rate. To this end, a sensor for in-motion continuous 3D shape measurement based on dual line-scan cameras is presented. In this paper, the principle and structure of the sensor are investigated. The image matching strategy is addressed and the matching error is analyzed. The sensor has been verified by experiments and high-quality results are obtained.
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China. bosun@tju.edu.cn.
authors.forename: Bo
authors.initials: B
authors.lastname: Sun
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China. jiguizhu@tju.edu.cn.
authors.forename: Jigui
authors.initials: J
authors.lastname: Zhu
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China. icelinker@tju.edu.cn.
authors.forename: Linghui
authors.initials: L
authors.lastname: Yang
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China. shouruiyang@tju.edu.cn.
authors.forename: Shourui
authors.initials: S
authors.lastname: Yang
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China. yin_guo@tju.edu.cn.
authors.forename: Yin
authors.initials: Y
authors.lastname: Guo
keywords: 3D shape measurement; industrial inspection; large-scale metrology; line-scan cameras; structured light