title: Application of dynamic impedance spectroscopy to atomic force microscopy.
abstract: Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.
authors.affiliation: Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza Street 11/12, 80-952 Gdańsk Wrzeszcz, Poland.
authors.forename: Kazimierz
authors.initials: K
authors.lastname: Darowicki
authors.affiliation: Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza Street 11/12, 80-952 Gdańsk Wrzeszcz, Poland.
authors.forename: Artur
authors.initials: A
authors.lastname: Zieliński
authors.affiliation: Department of Materials Engineering, Warsaw University of Technology, Wołoska Street 144, 02-507 Warsaw, Poland.
authors.forename: Krzysztof
authors.initials: K
authors.lastname: J Kurzydłowski
keywords: atomic force microscopy; dynamic electrochemical impedance spectroscopy; non-stationarity