title: Instantaneous phase shifting deflectometry.
abstract: An instantaneous phase shifting deflectometry measurement method is presented and implemented by measuring a time varying deformable mirror with an iPhone®6. The instantaneous method is based on multiplexing phase shifted fringe patterns with color, and decomposing them in x and y using Fourier techniques. Along with experimental data showing the capabilities of the instantaneous deflectometry system, a quantitative comparison with the Fourier transform profilometry method, which is a distinct phase measuring method from the phase shifting approach, is presented. Sources of error, nonlinear color-multiplexing induced error correction, and hardware limitations are discussed.
authors.forename: Isaac
authors.initials: I
authors.lastname: Trumper
authors.forename: Heejoo
authors.initials: H
authors.lastname: Choi
authors.forename: Dae Wook
authors.initials: DW
authors.lastname: Kim