title: NEXAFS study of electronic and atomic structure of active layer in Al/indium tin oxide/TiO2stack during resistive switching.
abstract: We have studied the stability of the resistive switching process in the Al/(In2O3)0.9(SnO2)0.1/TiO2assembly grown by atomic layer deposition. Besides electrical characterization the effect of electric field on the atomic electronic structure of the TiO2layer was studied using near edge X-ray absorption fine structure (NEXAFS) spectroscopy. The region of the current instability in the I-V characteristics was revealed. Presumably this current instability is supported by the amorphous structure of the TiO2film but is initiated by the surface morphology of the Al substrate. A formation of the O2molecules was established which occurs specifically in the region of the current instability that is a result of electrical Joule heating manifestation.
authors.affiliation: Institute of Physics, St Petersburg State University , Ul'yanovskaya Str. 1, Peterhof, 198504 , St Petersburg , Russia.
authors.forename: Elena
authors.initials: E
authors.lastname: Filatova
authors.affiliation: Institute of Physics, St Petersburg State University , Ul'yanovskaya Str. 1, Peterhof, 198504 , St Petersburg , Russia.
authors.forename: Aleksei
authors.initials: A
authors.lastname: Konashuk
authors.affiliation: Institute of Physics, St Petersburg State University , Ul'yanovskaya Str. 1, Peterhof, 198504 , St Petersburg , Russia.
authors.forename: Yuri
authors.initials: Y
authors.lastname: Petrov
authors.affiliation: Institute of Physics, St Petersburg State University , Ul'yanovskaya Str. 1, Peterhof, 198504 , St Petersburg , Russia.
authors.forename: Evgeny
authors.initials: E
authors.lastname: Ubyivovk
authors.affiliation: Institute Nanometre Optics and Technology (FG-INT), Helmholtz-Zentrum Berlin für Materialien und Energie GmbH , Albert Einstein Str. 15, 12489 , Berlin , Germany.
authors.forename: Andrey
authors.initials: A
authors.lastname: Sokolov
authors.affiliation: Institute of Physics, St Petersburg State University , Ul'yanovskaya Str. 1, Peterhof, 198504 , St Petersburg , Russia.
authors.forename: Andrei
authors.initials: A
authors.lastname: Selivanov
authors.affiliation: Institute of Physics, St Petersburg State University , Ul'yanovskaya Str. 1, Peterhof, 198504 , St Petersburg , Russia.
authors.forename: Victor
authors.initials: V
authors.lastname: Drozd
keywords: NEXAFS; ReRAM; current instability; local heating; molecular oxygen