title: A new setup for high resolution fast X-ray reflectivity data acquisition.
abstract: A new method for fast x-ray reflectivity data acquisition is presented. The method is based on a fast rotating, slightly tilted sample reflecting to a stationary mounted position sensitive detector and it allows for measurements of reflectivity curves in a quarter of a second. The resolution in q-space mainly depends on the beam properties and the pixel size of the detector. Maximum qz-value of 1 Å-1can be achieved. The time-temperature depending structure changes of poly(N-isopropylacrylamide) thin films were investigated in situ by applying the fast-reflectivity setup. The results are presented in this paper as illustration of the method and proof of principle.
authors.affiliation: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.
authors.forename: Milena
authors.initials: M
authors.lastname: Lippmann
authors.affiliation: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.
authors.forename: Adeline
authors.initials: A
authors.lastname: Buffet
authors.affiliation: Max-Planck-Institute for Solid State Research, Heisenbergstraße 1, 70569 Stuttgart, Germany.
authors.forename: Kathrin
authors.initials: K
authors.lastname: Pflaum
authors.affiliation: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.
authors.forename: Anita
authors.initials: A
authors.lastname: Ehnes
authors.affiliation: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.
authors.forename: Anca
authors.initials: A
authors.lastname: Ciobanu
authors.affiliation: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.
authors.forename: Oliver H
authors.initials: OH
authors.lastname: Seeck