title: A new nondestructive instrument for bulk residual stress measurement using tungsten kα1X-ray.
abstract: We describe an experimental instrument used for measuring nondestructively the residual stress using short wavelength X-ray, tungsten kα1. By introducing a photon energy screening technology, the monochromatic X-ray diffraction of tungsten kα1was realized using a CdTe detector. A high precision Huber goniometer is utilized in order to reduce the error in residual stress measurement. This paper summarizes the main performance of this instrument, measurement depth, stress error, as opposed to the neutron diffraction measurements of residual stress. Here, we demonstrate an application on the determination of residual stress in an aluminum alloy welded by the friction stir welding.
authors.affiliation: Science and Technology on Surface Physics and Chemistry Laboratory, P.O. Box No. 9-35, Huafengxincun, Jiangyou, Sichuan 621908, China.
authors.forename: Ce
authors.initials: C
authors.lastname: Ma
authors.affiliation: Science and Technology on Surface Physics and Chemistry Laboratory, P.O. Box No. 9-35, Huafengxincun, Jiangyou, Sichuan 621908, China.
authors.forename: Zuo-Yong
authors.initials: ZY
authors.lastname: Dou
authors.affiliation: Institute of Materials, China Academy of Engineering Physics, No. 9, Huafengxincun, Jiangyou, Sichuan 621908, China.
authors.forename: Li
authors.initials: L
authors.lastname: Chen
authors.affiliation: Institute of Materials, China Academy of Engineering Physics, No. 9, Huafengxincun, Jiangyou, Sichuan 621908, China.
authors.forename: Yun
authors.initials: Y
authors.lastname: Li
authors.affiliation: Science and Technology on Surface Physics and Chemistry Laboratory, P.O. Box No. 9-35, Huafengxincun, Jiangyou, Sichuan 621908, China.
authors.forename: Xiao
authors.initials: X
authors.lastname: Tan
authors.affiliation: Science and Technology on Surface Physics and Chemistry Laboratory, P.O. Box No. 9-35, Huafengxincun, Jiangyou, Sichuan 621908, China.
authors.forename: Ping
authors.initials: P
authors.lastname: Dong
authors.affiliation: Institute of Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China.
authors.forename: Jin
authors.initials: J
authors.lastname: Zhang
authors.affiliation: Institute of Southwest Technology Engineering, Chongqing 400039, China.
authors.forename: Lin
authors.initials: L
authors.lastname: Zheng
authors.affiliation: Science and Technology on Surface Physics and Chemistry Laboratory, P.O. Box No. 9-35, Huafengxincun, Jiangyou, Sichuan 621908, China.
authors.forename: Peng-Cheng
authors.initials: PC
authors.lastname: Zhang