title: Domain Wall Architecture in Tetragonal Ferroelectric Thin Films.
abstract: Non-Ising-like 180° ferroelectric domain wall architecture and domain distribution in tetragonal PbZrxTi1-xO3thin films are probed using a combination of optical second harmonic generation and scanning transmission electron microscopy. In the remnant state, a specific nonlinear optical signature of tilted 180° domain walls corresponding to a mixed Ising-Néel-type rotation of polarization across the wall is shown.
authors.affiliation: Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, ,8093, Zurich, Switzerland.
authors.forename: Gabriele
authors.initials: G
authors.lastname: De Luca
authors.affiliation: Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstrasse 129, ,8600, Dübendorf, Switzerland.
authors.forename: Marta D
authors.initials: MD
authors.lastname: Rossell
authors.affiliation: Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, ,8093, Zurich, Switzerland.
authors.forename: Jakob
authors.initials: J
authors.lastname: Schaab
authors.affiliation: Institut de Physique et Chimie des Matériaux de Strasbourg - CNRS UMR 7504, 67034, Strasbourg Cedex 2, France.
authors.forename: Nathalie
authors.initials: N
authors.lastname: Viart
authors.affiliation: Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, ,8093, Zurich, Switzerland.
authors.forename: Manfred
authors.initials: M
authors.lastname: Fiebig
authors.affiliation: Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, ,8093, Zurich, Switzerland.
authors.forename: Morgan
authors.initials: M
authors.lastname: Trassin
keywords: Ising-Néel wall; PZT thin films; ferroelectric domain wall