title: Rapid mapping of polarization switching through complete information acquisition.
abstract: Polarization switching in ferroelectric and multiferroic materials underpins a broad range of current and emergent applications, ranging from random access memories to field-effect transistors, and tunnelling devices. Switching in these materials is exquisitely sensitive to local defects and microstructure on the nanometre scale, necessitating spatially resolved high-resolution studies of these phenomena. Classical piezoresponse force microscopy and spectroscopy, although providing necessary spatial resolution, are fundamentally limited in data acquisition rates and energy resolution. This limitation stems from their two-tiered measurement protocol that combines slow (∼1 s) switching and fast (∼10 kHz-1 MHz) detection waveforms. Here we develop an approach for rapid probing of ferroelectric switching using direct strain detection of material response to probe bias. This approach, facilitated by high-sensitivity electronics and adaptive filtering, enables spectroscopic imaging at a rate 3,504 times faster the current state of the art, achieving high-veracity imaging of polarization dynamics in complex microstructures.
authors.affiliation: The Institute for Functional Imaging of Materials and The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Mail Stop 6487, Oak Ridge, Tennessee 37831, USA.
authors.forename: Suhas
authors.identifier: http://orcid.org/0000-0002-5398-3050
authors.initials: S
authors.lastname: Somnath
authors.affiliation: The Institute for Functional Imaging of Materials and The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Mail Stop 6487, Oak Ridge, Tennessee 37831, USA.
authors.forename: Alex
authors.identifier: http://orcid.org/0000-0002-3975-4112
authors.initials: A
authors.lastname: Belianinov
authors.affiliation: The Institute for Functional Imaging of Materials and The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Mail Stop 6487, Oak Ridge, Tennessee 37831, USA.
authors.forename: Sergei V
authors.identifier: http://orcid.org/0000-0001-5354-6152
authors.initials: SV
authors.lastname: Kalinin
authors.affiliation: The Institute for Functional Imaging of Materials and The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Mail Stop 6487, Oak Ridge, Tennessee 37831, USA.
authors.forename: Stephen
authors.initials: S
authors.lastname: Jesse