title: Applications of Doppler-free saturation spectroscopy for edge physics studies (invited).
abstract: Doppler-free saturation spectroscopy provides a very powerful method to obtain detailed information about the electronic structure of the atom through measurement of the spectral line profile. This is achieved through a significant decrease in the Doppler broadening and essentially an elimination of the instrument broadening inherent to passive spectroscopic techniques. In this paper we present the technique and associated physics of Doppler-free saturation spectroscopy in addition to how one selects the appropriate transition. Simulations of Hδspectra are presented to illustrate the increased sensitivity to both electric field and electron density measurements.
authors.affiliation: Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
authors.forename: E H
authors.initials: EH
authors.lastname: Martin
authors.affiliation: Department of Nuclear Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA.
authors.forename: A
authors.initials: A
authors.lastname: Zafar
authors.affiliation: Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
authors.forename: J B O
authors.initials: JB
authors.lastname: Caughman
authors.affiliation: Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
authors.forename: R C
authors.initials: RC
authors.lastname: Isler
authors.affiliation: Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
authors.forename: G L
authors.initials: GL
authors.lastname: Bell