title: Low-energy Cathodoluminescence for (Oxy)Nitride Phosphors.
abstract: Nitride and oxynitride (Sialon) phosphors are good candidates for the ultraviolet and visible emission applications. High performance, good stability and flexibility of their emission properties can be achieved by controlling their composition and dopants. However, a lot of work is still required to improve their properties and to reduce the production cost. A possible approach is to correlate the luminescence properties of the Sialon particles with their local structural and chemical environment in order to optimize their growth parameters and find novel phosphors. For such a purpose, the low-voltage cathodoluminescence (CL) microscopy is a powerful technique. The use of electron as an excitation source allows detecting most of the luminescence centers, revealing their luminescence distribution spatially and in depth, directly comparing CL results with the other electron-based techniques, and investigating the stability of their luminescence properties under stress. Such advantages for phosphors characterization will be highlighted through examples of investigation on several Sialon phosphors by low-energy CL.
authors.affiliation: Graduate School of Pure and Applied Science, University of Tsukuba; Nano Device Characterization Group, National Institute for Materials Science (NIMS); Cho.Yujin@nims.go.jp.
authors.forename: Yujin
authors.initials: Y
authors.lastname: Cho
authors.affiliation: CNRS - Saint-Gobain, UMI 3629, Laboratory for Innovative Key Materials and Structures (LINK).
authors.forename: Benjamin
authors.initials: B
authors.lastname: Dierre
authors.affiliation: Nano Device Characterization Group, National Institute for Materials Science (NIMS).
authors.forename: Takashi
authors.initials: T
authors.lastname: Sekiguchi
authors.affiliation: Sialon Unit, National Institute for Materials Science (NIMS).
authors.forename: Takayuki
authors.initials: T
authors.lastname: Suehiro
authors.affiliation: Sialon Unit, National Institute for Materials Science (NIMS).
authors.forename: Kohsei
authors.initials: K
authors.lastname: Takahashi
authors.affiliation: Sialon Unit, National Institute for Materials Science (NIMS).
authors.forename: Takashi
authors.initials: T
authors.lastname: Takeda
authors.affiliation: Sialon Unit, National Institute for Materials Science (NIMS).
authors.forename: Rong-Jun
authors.initials: RJ
authors.lastname: Xie
authors.affiliation: Sialon Unit, National Institute for Materials Science (NIMS).
authors.forename: Yoshinobu
authors.initials: Y
authors.lastname: Yamamoto
authors.affiliation: Sialon Unit, National Institute for Materials Science (NIMS).
authors.forename: Naoto
authors.initials: N
authors.lastname: Hirosaki
mesh_terms: D004583:Electrons; D049449:Luminescence; D008163:Luminescent Measurements; D008853:Microscopy; D008855:Microscopy, Electron, Scanning; D009584:Nitrogen; D010316:Particle Size
chemical_list: D009584:Nitrogen