title: Three-Dimensional Continuous Displacement Measurement with Temporal Speckle Pattern Interferometry.
abstract: A speckle interferometer which can measure whole field three-dimensional displacements continuously and dynamically has been built. Three different wavelength lasers are used to produce the speckle interferograms of the two in-plane displacements (displacements in thex- andy-direction) and one out-of-plane displacement (displacement in thez-direction), respectively. One color CCD camera is employed to collect these mixed speckle interferograms simultaneously. The mixed interferograms are separated by the Red, Green and Blue channels of the color CCD camera, and then are processed by the wavelet transform technique to extract the phase information of the measured object. The preliminary experiment is carried out to demonstrate the performance of this new device.
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China. 14121619@bjtu.edu.cn.
authors.forename: Jie
authors.initials: J
authors.lastname: Qin
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China. zhangao@bjtu.edu.cn.
authors.forename: Zhan
authors.initials: Z
authors.lastname: Gao
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China. 15121631@bjtu.edu.cn.
authors.forename: Xu
authors.initials: X
authors.lastname: Wang
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China. 15121635@bjtu.edu.cn.
authors.forename: Shanwei
authors.initials: S
authors.lastname: Yang
keywords: displacement sensor; temporal spackle pattern interferometry; three-dimensional measurement; wavelet transform