title: In-situ straining and time-resolved electron tomography data acquisition in a transmission electron microscope.
abstract: This paper reports the preliminary results of a new in-situ three-dimensional (3D) imaging system for observing plastic deformation behavior in a transmission electron microscope (TEM) as a directly relevant development of the recently reported straining-and-tomography holder [Sato K et al. (2015) Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography. Microsc. 64: 369-375]. We designed an integrated system using the holder and newly developed straining and image-acquisition software and then developed an experimental procedure for in-situ straining and time-resolved electron tomography (ET) data acquisition. The software for image acquisition and 3D visualization was developed based on the commercially available ET software TEMographyTM. We achieved time-resolved 3D visualization of nanometer-scale plastic deformation behavior in a Pb-Sn alloy sample, thus demonstrating the capability of this system for potential applications in materials science.
authors.affiliation: Department of Electrical and Materials Science and Engineering and The Ultramicroscopy Research Center, Kyushu University, 6-1 Kasugakoen, Kasuga-shi, Fukuoka 816-8580, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Hata
authors.affiliation: FEI Company Japan Ltd. (Currently, Materials and Structural Analysis, Thermo Fisher Scientific), 4-12-2 Higashi-Shinagawa, Shinagawa-ku, Tokyo 140-0002, Japan.|Mel-Build Corporation, 3-1-15, Shimoyamato, Nishi-ku, Fukuoka 819-0052, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Miyazaki
authors.affiliation: Mel-Build Corporation, 3-1-15, Shimoyamato, Nishi-ku, Fukuoka 819-0052, Japan.
authors.forename: T
authors.initials: T
authors.lastname: Gondo
authors.affiliation: Engineering Department, System in Frontier Inc., 2-8-3, Shinsuzuharu bldg. 4F, Akebono-cho, Tachikawa-shi, Tokyo 190-0012, Japan.
authors.forename: K
authors.initials: K
authors.lastname: Kawamoto
authors.affiliation: Engineering Department, System in Frontier Inc., 2-8-3, Shinsuzuharu bldg. 4F, Akebono-cho, Tachikawa-shi, Tokyo 190-0012, Japan.
authors.forename: N
authors.initials: N
authors.lastname: Horii
authors.affiliation: Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
authors.forename: K
authors.initials: K
authors.lastname: Sato
authors.affiliation: System in Frontier Inc., 2-8-3, Shinsuzuharu bldg. 4F, Akebono-cho, Tachikawa-shi, Tokyo 190-0012, Japan.
authors.forename: H
authors.initials: H
authors.lastname: Furukawa
authors.affiliation: Faculty of Engineering, Information and Systems, University of Tsukuba, Tennoudai 1-1-1, Tsukuba 305-8573, Japan.|JST-ERATO, Momose Quantum-Beam Phase Imaging Project, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan.
authors.forename: H
authors.initials: H
authors.lastname: Kudo
authors.affiliation: Mel-Build Corporation, 3-1-15, Shimoyamato, Nishi-ku, Fukuoka 819-0052, Japan.
authors.forename: H
authors.initials: H
authors.lastname: Miyazaki
authors.affiliation: Department of Materials Science and Engineering, Virginia Tech, 134 Randolph Hall (MC 0286), 460 Old Turner Street, Blacksburg, VA 24061, USA.
authors.forename: M
authors.initials: M
authors.lastname: Murayama
keywords: dynamic observation; electron tomography; four-dimensional (4D) observation; in-situ deformation; in-situ transmission electron microscopy; time-resolved three-dimensional (3D) observation