title: Time-over-threshold for pulse shape discrimination in a time-of-flight phoswich PET detector.
abstract: It is well known that a PET detector capable of measuring both photon time-of-flight (TOF) and depth-of-interaction (DOI) improves the image quality and accuracy. Phoswich designs have been realized in PET detectors to measure DOI for more than a decade. However, PET detectors based on phoswich designs put great demand on the readout circuits, which have to differentiate the pulse shape produced by different crystal layers. A simple pulse shape discrimination approach is required to realize the phoswich designs in a clinical PET scanner, which consists of thousands of scintillation crystal elements. In this work, we studied time-over-threshold (ToT) as a pulse shape parameter for DOI. The energy, timing and DOI performance were evaluated for a phoswich detector design comprising [Formula: see text] mm LYSO:Ce crystal optically coupled to [Formula: see text] mm calcium co-doped LSO:Ce,Ca(0.4%) crystal read out by a silicon photomultiplier (SiPM). A DOI accuracy of 97.2% has been achieved for photopeak events using the proposed time-over-threshold (ToT) processing. The energy resolution without correction for SiPM non-linearity was [Formula: see text]% and [Formula: see text]% FWHM at 511 keV for LYSO and LSO crystal layers, respectively. The coincidence time resolution for photopeak events ranges from 164.6 ps to 183.1 ps FWHM, depending on the layer combinations. The coincidence time resolution for inter-crystal scatter events ranges from 214.6 ps to 418.3 ps FWHM, depending on the energy windows applied. These results show great promises of using ToT for pulse shape discrimination in a TOF phoswich detector since a ToT measurement can be easily implemented in readout electronics.
authors.affiliation: Department of Applied Physics, Stanford University, Stanford, CA, USA. Molecular Imaging Program at Stanford (MIPS), Department of Radiology, Stanford University, Stanford, CA, USA.
authors.forename: Chen-Ming
authors.initials: CM
authors.lastname: Chang
authors.forename: Joshua W
authors.initials: JW
authors.lastname: Cates
authors.forename: Craig S
authors.initials: CS
authors.lastname: Levin
mesh_terms: D055615:Electrical Equipment and Supplies; D017785:Photons; D049268:Positron-Emission Tomography / Q000295:instrumentation*; D012825:Silicon; D013997:Time Factors
chemical_list: D012825:Silicon