title: Voltage Fluctuation in a Supercapacitor During a High-g Impact.
abstract: Supercapacitors (SCs) are a type of energy storage device with high power density and long lifecycles. They have widespread applications, such as powering electric vehicles and micro scale devices. Working stability is one of the most important properties of SCs, and it is of significant importance to investigate the operational characteristics of SCs working under extreme conditions, particularly during high-g acceleration. In this paper, the failure mechanism of SCs upon high-g impact is thoroughly studied. Through an analysis of the intrinsic reaction mechanism during the high-g impact, a multi-faceted physics model is established. Additionally, a multi-field coupled kinetics simulation of the SC failure during a high-g impact is presented. Experimental tests are conducted that confirm the validity of the proposed model. The key factors of failure, such as discharge currents and discharging levels, are analyzed and discussed. Finally, a possible design is proposed to avoid the failure of SCs upon high-g impact.
authors.affiliation: Collaborative Innovation Center for Micro/Nano Fabrication, Device and System, State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, China.
authors.forename: Keren
authors.initials: K
authors.lastname: Dai
authors.affiliation: Collaborative Innovation Center for Micro/Nano Fabrication, Device and System, State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, China.
authors.forename: Xiaofeng
authors.initials: X
authors.lastname: Wang
authors.affiliation: Collaborative Innovation Center for Micro/Nano Fabrication, Device and System, State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, China.
authors.forename: Yajiang
authors.initials: Y
authors.lastname: Yin
authors.affiliation: Collaborative Innovation Center for Micro/Nano Fabrication, Device and System, State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, China.
authors.forename: Chenglong
authors.initials: C
authors.lastname: Hao
authors.affiliation: Collaborative Innovation Center for Micro/Nano Fabrication, Device and System, State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, China.
authors.forename: Zheng
authors.initials: Z
authors.lastname: You