title: Using Geometry To Sense Current.
abstract: We describe a superconducting three-terminal device that uses a simple geometric effect known as current crowding to sense the flow of current and actuate a readout signal. The device consists of a "Y"-shaped current combiner, with two currents (sense and bias) entering separately through the top arms of the "Y", intersecting, and then exiting together through the bottom leg of the "Y". When current is added to or removed from one of the arms (e.g., the sense arm), the superconducting critical current in the other arm (i.e., the bias arm) is modulated. The current in the sense arm can thus be determined by measuring the critical current of the bias arm, or inversely, the sense current can be used to modulate the state of the bias arm. The dependence of the bias critical current on the sense current occurs due to the geometric current crowding effect, which causes the sense current to interact locally with the bias arm. Measurement of the critical current in the bias arm does not break the superconducting state of the sense arm or of the bottom leg, and thus, quantized currents trapped in a superconducting loop were able to be repeatedly measured without changing the state of the loop. Current crowding is a universal effect in nanoscale superconductors, and so this device has potential for applicability across a broad range of superconducting technologies and materials. More generally, any technology in which geometrically induced flow crowding exists in the presence of a strong nonlinearity might make use of this type of device.
authors.affiliation: Research Laboratory of Electronics, Massachusetts Institute of Technology , 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.
authors.forename: Adam N
authors.initials: AN
authors.lastname: McCaughan
authors.affiliation: Research Laboratory of Electronics, Massachusetts Institute of Technology , 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.
authors.forename: Nathnael S
authors.initials: NS
authors.lastname: Abebe
authors.affiliation: Research Laboratory of Electronics, Massachusetts Institute of Technology , 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.
authors.forename: Qing-Yuan
authors.initials: QY
authors.lastname: Zhao
authors.affiliation: Research Laboratory of Electronics, Massachusetts Institute of Technology , 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.
authors.forename: Karl K
authors.initials: KK
authors.lastname: Berggren
keywords: current crowding; electronics; fluxon; memory; nondestructive readout; superconductivity; yTron