title: A new method for simultaneous measurement of Seebeck coefficient and resistivity.
abstract: A new method has been proposed and verified to measure the Seebeck coefficient and electrical resistivity of a sample in the paper. Different from the conventional method for Seebeck coefficient and resistivity measurement, the new method adopts a four-point configuration to measure both the Seebeck coefficient and resistivity. It can well identify the inhomogeneity of the sample by simply comparing the four Seebeck coefficients of different probe combinations, and it is more accurate and appropriate to take the average value of the four Seebeck coefficients as the measured result of the Seebeck coefficient of the sample than that measured by the two-point method. Furthermore, the four-point configuration makes it also very convenient to measure the resistivity by using the Van der Pauw method. The validity of this method has been verified with both the constantan alloy and p-type Bi2Te3semiconductor samples, and the measurement results are in good agreement with those obtained by commercial available equipment.
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Xu
authors.initials: X
authors.lastname: He
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Junyou
authors.initials: J
authors.lastname: Yang
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Qinghui
authors.initials: Q
authors.lastname: Jiang
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Yubo
authors.initials: Y
authors.lastname: Luo
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Dan
authors.initials: D
authors.lastname: Zhang
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Zhiwei
authors.initials: Z
authors.lastname: Zhou
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Yangyang
authors.initials: Y
authors.lastname: Ren
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Xin
authors.initials: X
authors.lastname: Li
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Jiwu
authors.initials: J
authors.lastname: Xin
authors.affiliation: State Key Laboratory of Materials Processing and Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: Jingdi
authors.initials: J
authors.lastname: Hou