title: An electron energy loss spectrometer based streak camera for time resolved TEM measurements.
abstract: We propose an experimental setup based on a streak camera approach inside an energy filter to measure time resolved properties of materials in the transmission electron microscope (TEM). In order to put in place the streak camera, a beam sweeper was built inside an energy filter. After exciting the TEM sample, the beam is swept across the CCD camera of the filter. We describe different parts of the setup at the example of a magnetic measurement. This setup is capable to acquire time resolved diffraction patterns, electron energy loss spectra (EELS) and images with total streaking times in the range between 100ns and 10μs.
authors.affiliation: Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, 75121 Uppsala, Sweden.
authors.forename: Hasan
authors.initials: H
authors.lastname: Ali
authors.affiliation: Department of Physics and Astronomy, Uppsala University, Box 516, 75120 Uppsala, Sweden.
authors.forename: Johan
authors.initials: J
authors.lastname: Eriksson
authors.affiliation: Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, 75121 Uppsala, Sweden.
authors.forename: Hu
authors.initials: H
authors.lastname: Li
authors.affiliation: Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, 75121 Uppsala, Sweden.
authors.forename: S Hassan M
authors.initials: SHM
authors.lastname: Jafri
authors.affiliation: Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, 75121 Uppsala, Sweden.
authors.forename: M S Sharath
authors.initials: MSS
authors.lastname: Kumar
authors.affiliation: Department of Physics and Astronomy, Uppsala University, Box 516, 75120 Uppsala, Sweden.
authors.forename: Jim
authors.initials: J
authors.lastname: Ögren
authors.affiliation: Department of Physics and Astronomy, Uppsala University, Box 516, 75120 Uppsala, Sweden.
authors.forename: Volker
authors.initials: V
authors.lastname: Ziemann
authors.affiliation: Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, 75121 Uppsala, Sweden. Electronic address: Klaus.Leifer@angstrom.uu.se.
authors.forename: Klaus
authors.initials: K
authors.lastname: Leifer
keywords: Energy filter; Streak camera; Sweep; TEM; Time resolved