title: Development of synchrotron X-ray micro-tomography under extreme conditions of pressure and temperature.
abstract: X-ray tomography is a non-destructive three-dimensional imaging/microanalysis technique selective to a wide range of properties such as density, chemical composition, chemical states and crystallographic structure with extremely high sensitivity and spatial resolution. Here the development of in situ high-pressure high-temperature micro-tomography using a rotating module for the Paris-Edinburgh cell combined with synchrotron radiation is described. By rotating the sample chamber by 360°, the limited angular aperture of ordinary high-pressure cells is surmounted. Such a non-destructive high-resolution probe provides three-dimensional insight on the morphological and structural evolution of crystalline as well as amorphous phases during high pressure and temperature treatment. To demonstrate the potentials of this new experimental technique the compression behavior of a basalt glass is investigated by X-ray absorption tomography, and diffraction/scattering tomography imaging of the structural changes during the polymerization of C60molecules under pressure is performed. Small size and weight of the loading frame and rotating module means that this apparatus is portable, and can be readily installed on most synchrotron facilities to take advantage of the diversity of three-dimensional imaging techniques available at beamlines. This experimental breakthrough should open new ways for in situ imaging of materials under extreme pressure-temperature-stress conditions, impacting diverse areas in physics, chemistry, geology or materials sciences.
authors.affiliation: European Synchrotron Radiation Facility, BP 220, 38043 Grenoble, France.
authors.forename: M
authors.initials: M
authors.lastname: Álvarez-Murga
authors.affiliation: Laboratoire de Géologie de Lyon, UMR5276, Université Claude Bernard Lyon 1 - CNRS, Ens de Lyon, 69622 Villeurbanne, France.
authors.forename: J P
authors.initials: JP
authors.lastname: Perrillat
authors.affiliation: Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie, UMR 7590, CNRS - UPMC Sorbonne Universités, 4 place Jussieu, 75005 Paris, France.
authors.forename: Y
authors.initials: Y
authors.lastname: Le Godec
authors.affiliation: Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie, UMR 7590, CNRS - UPMC Sorbonne Universités, 4 place Jussieu, 75005 Paris, France.
authors.forename: F
authors.initials: F
authors.lastname: Bergame
authors.affiliation: Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie, UMR 7590, CNRS - UPMC Sorbonne Universités, 4 place Jussieu, 75005 Paris, France.
authors.forename: J
authors.initials: J
authors.lastname: Philippe
authors.affiliation: Synchrotron Soleil, L'Orme des Merisiers, St Aubin, 91192 Gif-sur-Yvette, France.
authors.forename: A
authors.initials: A
authors.lastname: King
authors.affiliation: Synchrotron Soleil, L'Orme des Merisiers, St Aubin, 91192 Gif-sur-Yvette, France.
authors.forename: N
authors.initials: N
authors.lastname: Guignot
authors.affiliation: European Synchrotron Radiation Facility, BP 220, 38043 Grenoble, France.
authors.forename: M
authors.initials: M
authors.lastname: Mezouar
authors.affiliation: Institut Néel, CNRS - Université Grenoble Alpes, BP 166, 38042 Grenoble, France.
authors.forename: J L
authors.initials: JL
authors.lastname: Hodeau
keywords: C60 polymerization; X-ray absorption tomography; basalt glass; diffraction scattering tomography; high pressure