title: A Problem in AC Quantized Hall Resistance Measurements and a Proposed Solution.
abstract: In all experiments reported to date the measured values of the ac quantized Hall resistancesRHvaried with the frequency of the applied current, and differed significantly from the dc values ofRH, making it difficult to use the ac quantum Hall effect as an absolute impedance standard. We analyze the effects due to the large capacitances-to-shields existing in the sample probes on measurements ofRHto see if this is the source of the problem. Equivalent electrical circuits are utilized; they contain capacitances and leakage resistances to the sample probe shields, longitudinal resistances within the quantized Hall effect devices, and multiple connections to the devices. The algebraic solutions for theRHvalues in these circuits reveal large out-of-phase contributions to the quantized Hall voltagesVHthat would make it difficult to do accurate measurements with high precision ac bridges. These large out-of-phase contributions could introduce the linear frequency dependences observed in previousRHmeasurements. We predict, however, that quadruple-series connections to the quantum Hall devices yield only small out-of-phase contributions toVHwhich may allow accurate measurements of the quantityRH-Rx, whereRxis the longitudinal resistance along the device.
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
authors.forename: M E
authors.initials: ME
authors.lastname: Cage
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
authors.forename: A
authors.initials: A
authors.lastname: Jeffery
keywords: ac quantum Hall effect; capacitance-to-shield; equivalent electrical circuit; longitudinal resistance; multi-series connections; quantized Hall resistance