title: Surface science at the PEARL beamline of the Swiss Light Source.
abstract: The Photo-Emission and Atomic Resolution Laboratory (PEARL) is a new soft X-ray beamline and surface science laboratory at the Swiss Light Source. PEARL is dedicated to the structural characterization of local bonding geometry at surfaces and interfaces of novel materials, in particular of molecular adsorbates, nanostructured surfaces, and surfaces of complex materials. The main experimental techniques are soft X-ray photoelectron spectroscopy, photoelectron diffraction, and scanning tunneling microscopy (STM). Photoelectron diffraction in angle-scanned mode measures bonding angles of atoms near the emitter atom, and thus allows the orientation of small molecules on a substrate to be determined. In energy scanned mode it measures the distance between the emitter and neighboring atoms; for example, between adsorbate and substrate. STM provides complementary, real-space information, and is particularly useful for comparing the sample quality with reference measurements. In this article, the key features and measured performance data of the beamline and the experimental station are presented. As scientific examples, the adsorbate-substrate distance in hexagonal boron nitride on Ni(111), surface quantum well states in a metal-organic network of dicyano-anthracene on Cu(111), and circular dichroism in the photoelectron diffraction of Cu(111) are discussed.
authors.affiliation: Paul Scherrer Institut, Villigen, Switzerland.
authors.forename: Matthias
authors.initials: M
authors.lastname: Muntwiler
authors.affiliation: Paul Scherrer Institut, Villigen, Switzerland.
authors.forename: Jun
authors.initials: J
authors.lastname: Zhang
authors.affiliation: Paul Scherrer Institut, Villigen, Switzerland.
authors.forename: Roland
authors.initials: R
authors.lastname: Stania
authors.affiliation: Nara Institute of Science and Technology (NAIST), Nara, Japan.
authors.forename: Fumihiko
authors.initials: F
authors.lastname: Matsui
authors.affiliation: Paul Scherrer Institut, Villigen, Switzerland.
authors.forename: Peter
authors.initials: P
authors.lastname: Oberta
authors.affiliation: Paul Scherrer Institut, Villigen, Switzerland.
authors.forename: Uwe
authors.initials: U
authors.lastname: Flechsig
authors.affiliation: Paul Scherrer Institut, Villigen, Switzerland.
authors.forename: Luc
authors.initials: L
authors.lastname: Patthey
authors.affiliation: Paul Scherrer Institut, Villigen, Switzerland.
authors.forename: Christoph
authors.initials: C
authors.lastname: Quitmann
authors.affiliation: Universität Basel, Basel, Switzerland.
authors.forename: Thilo
authors.initials: T
authors.lastname: Glatzel
authors.affiliation: Swiss Federal Laboratories for Materials Science and Technology (Empa), Dübendorf, Switzerland.
authors.forename: Roland
authors.initials: R
authors.lastname: Widmer
authors.affiliation: Universität Basel, Basel, Switzerland.
authors.forename: Ernst
authors.initials: E
authors.lastname: Meyer
authors.affiliation: Paul Scherrer Institut, Villigen, Switzerland.
authors.forename: Thomas A
authors.initials: TA
authors.lastname: Jung
authors.affiliation: Université de Fribourg, Fribourg, Switzerland.
authors.forename: Philipp
authors.initials: P
authors.lastname: Aebi
authors.affiliation: Swiss Federal Laboratories for Materials Science and Technology (Empa), Dübendorf, Switzerland.
authors.forename: Roman
authors.initials: R
authors.lastname: Fasel
authors.affiliation: Universität Zürich, Zürich, Switzerland.
authors.forename: Thomas
authors.initials: T
authors.lastname: Greber
keywords: X-ray photoelectron diffraction; X-ray photoelectron spectroscopy; scanning tunneling microscopy