title: Topochemical Analysis of Cell Wall Components by TOF-SIMS.
abstract: Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a recently developing analytical tool and a type of imaging mass spectrometry. TOF-SIMS provides mass spectral information with a lateral resolution on the order of submicrons, with widespread applicability. Sometimes, it is described as a surface analysis method without the requirement for sample pretreatment; however, several points need to be taken into account for the complete utilization of the capabilities of TOF-SIMS. In this chapter, we introduce methods for TOF-SIMS sample treatments, as well as basic knowledge of wood samples TOF-SIMS spectral and image data analysis.
authors.affiliation: Graduate School of Bioagricultural Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8601, Japan.
authors.forename: Dan
authors.initials: D
authors.lastname: Aoki
authors.affiliation: Graduate School of Bioagricultural Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8601, Japan. kazu@agr.nagoya-u.ac.jp.
authors.forename: Kazuhiko
authors.initials: K
authors.lastname: Fukushima
mesh_terms: D002473:Cell Wall / Q000737:chemistry*; D002482:Cellulose / Q000032:analysis; D008031:Lignin / Q000032:analysis; D064209:Phytochemicals / Q000032:analysis*; D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods; D014934:Wood / Q000737:chemistry
chemical_list: D064209:Phytochemicals; D002482:Cellulose; D008031:Lignin
keywords: Cellulose; Chemical mapping; Extractives; Inorganic metals; Lignin; TOF-SIMS