title: Endurance and Cycle-to-cycle Uniformity Improvement in Tri-Layered CeO2/Ti/CeO2Resistive Switching Devices by Changing Top Electrode Material.
abstract: Resistance switching characteristics of CeO2/Ti/CeO2tri-layered films sandwiched between Pt bottom electrode and two different top electrodes (Ti and TaN) with different work functions have been investigated. RRAM memory cells composed of TaN/CeO2/Ti/CeO2/Pt reveal better resistive switching performance instead of Ti/CeO2/Ti/CeO2/Pt memory stacks. As compared to the Ti/CeO2interface, much better ability of TaN/CeO2interface to store and exchange plays a key role in the RS performance improvement, including lower forming/SET voltages, large memory window (~102) and no significant data degradation during endurance test of >104switching cycles. The formation of TaON thinner interfacial layer between TaN TE and CeO2film is found to be accountable for improved resistance switching behavior. Partial charge density of states is analyzed using density functional theory. It is found that the conductive filaments formed in CeO2based devices is assisted by interstitial Ti dopant. Better stability and reproducibility in cycle-to-cycle (C2C) resistance distribution and Vset/Vresetuniformity were achieved due to the modulation of current conduction mechanism from Ohmic in low field region to Schottky emission in high field region.
authors.affiliation: Thin Films Laboratory, Department of Physics, Bahauddin Zakariya University, Multan-60800, Pakistan.
authors.forename: Anwar Manzoor
authors.initials: AM
authors.lastname: Rana
authors.affiliation: Thin Films Laboratory, Department of Physics, Bahauddin Zakariya University, Multan-60800, Pakistan.
authors.forename: Tahira
authors.initials: T
authors.lastname: Akbar
authors.affiliation: Department of Physics, Government College University Faisalabad, Layyah Campus Layyah-31200, Pakistan.
authors.forename: Muhammad
authors.initials: M
authors.lastname: Ismail
authors.affiliation: Thin Films Laboratory, Department of Physics, Bahauddin Zakariya University, Multan-60800, Pakistan.
authors.forename: Ejaz
authors.initials: E
authors.lastname: Ahmad
authors.affiliation: Thin Films Laboratory, Department of Physics, Bahauddin Zakariya University, Multan-60800, Pakistan.
authors.forename: Fayyaz
authors.initials: F
authors.lastname: Hussain
authors.affiliation: Thin Films Laboratory, Department of Physics, Bahauddin Zakariya University, Multan-60800, Pakistan.
authors.forename: Ijaz
authors.initials: I
authors.lastname: Talib
authors.affiliation: Thin Films Laboratory, Department of Physics, Bahauddin Zakariya University, Multan-60800, Pakistan.
authors.forename: Muhammad
authors.initials: M
authors.lastname: Imran
authors.affiliation: Institute of Chemical Sciences, Bahauddin Zakariya University, Multan-60800, Pakistan.
authors.forename: Khalid
authors.initials: K
authors.lastname: Mehmood
authors.affiliation: Department of Radiation Oncology, Shaukat Khanum Memorial Cancer Hospital and Research Centre, Lahore-54000, Pakistan.
authors.forename: Khalid
authors.initials: K
authors.lastname: Iqbal
authors.affiliation: Thin Films Laboratory, Department of Physics, Bahauddin Zakariya University, Multan-60800, Pakistan.
authors.forename: M Younus
authors.initials: MY
authors.lastname: Nadeem