title: Effect of oxygen ion irradiation on dielectric, structural, chemical and thermoluminescence properties of natural muscovite mica.
abstract: Thin cleaved samples (~18µm) of natural muscovite mica were irradiated with 80MeV oxygen ion beam at fluence ranging from 1×1012to 5×1013ion/cm2. The alterations in dielectric, structural, chemical and thermoluminescence properties of irradiated as well as pristine samples have been investigated. Dielectric constant decreases while other dielectric parameters such as dielectric loss, tanδ, ac conductivity,real and imaginary parts of electric modulus increase with increase of ion fluence. Williamson Hall investigation has been utilized to ascertain crystallite size and micro strain of pristine and irradiated samples. The XRD analysis revealed a significant increase in micro strain and dislocation density with an increase of ion fluence. The variations in dielectric properties upon irradiation are collaborated with structural modifications in the muscovite. No appreciable changes in characteristic bands (FTIR) have been observed after irradiation, indicating that natural muscovite mica is chemically stable. Natural muscovite mica has eminent applications in heavy ions dosimetry due to observation of well defined single peak at 303°C with activation energy of 1.24eV in TL spectrum.
authors.affiliation: Department of Physics, Guru Nanak Dev University, Amritsar 143005, Punjab, India. Electronic address: sukhnandanphy@gmail.com.
authors.forename: Sukhnandan
authors.initials: S
authors.lastname: Kaur
authors.affiliation: Department of Physics, Guru Nanak Dev University, Amritsar 143005, Punjab, India.
authors.forename: Surinder
authors.initials: S
authors.lastname: Singh
authors.affiliation: Department of Physics, Guru Nanak Dev University, Amritsar 143005, Punjab, India.
authors.forename: Lakhwant
authors.initials: L
authors.lastname: Singh
keywords: Dielectric properties; FTIR; Muscovite mica; Oxygen ion irradiation; Thermoluminescence; XRD