title: Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources.
abstract: We describe the design and commissioning of a novel aberration-corrected low energy electron microscope (AC-LEEM). A third magnetic prism array (MPA) is added to the standard AC-LEEM with two prism arrays, allowing the incorporation of an ultrafast spin-polarized electron source alongside the standard cold field emission electron source, without degrading spatial resolution. The high degree of symmetries of the AC-LEEM are utilized while we design the electron optics of the ultrafast spin-polarized electron source, so as to minimize the deleterious effect of time broadening, while maintaining full control of electron spin. A spatial resolution of 2nm and temporal resolution of 10ps (ps) are expected in the future time resolved aberration-corrected spin-polarized LEEM (TR-AC-SPLEEM). The commissioning of the three-prism AC-LEEM has been successfully finished with the cold field emission source, with a spatial resolution below 2nm.
authors.affiliation: College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China; Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
authors.forename: Weishi
authors.initials: W
authors.lastname: Wan
authors.affiliation: College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China.
authors.forename: Lei
authors.initials: L
authors.lastname: Yu
authors.affiliation: College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China.
authors.forename: Lin
authors.initials: L
authors.lastname: Zhu
authors.affiliation: College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China.
authors.forename: Xiaodong
authors.initials: X
authors.lastname: Yang
authors.affiliation: College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China.
authors.forename: Zheng
authors.initials: Z
authors.lastname: Wei
authors.affiliation: College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China; Mechanical and Aerospace Engineering, Monash University, Clayton, VIC 3800, Australia.
authors.forename: Jefferson Zhe
authors.initials: JZ
authors.lastname: Liu
authors.affiliation: College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China; Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
authors.forename: Jun
authors.initials: J
authors.lastname: Feng
authors.affiliation: SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin, Germany.
authors.forename: Kai
authors.initials: K
authors.lastname: Kunze
authors.affiliation: SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin, Germany.
authors.forename: Oliver
authors.initials: O
authors.lastname: Schaff
authors.affiliation: IBM Research Division, T.J. Watson Research Center, Yorktown Heights, NY 10598, USA.
authors.forename: Ruud
authors.initials: R
authors.lastname: Tromp
authors.affiliation: College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China; School of Physics, Monash University, Clayton, VIC 3800, Australia. Electronic address: wenxintang@cqu.edu.cn.
authors.forename: Wen-Xin
authors.initials: WX
authors.lastname: Tang
keywords: Aberration correction; LEEM; SPLEEM; STM