title: Background data for modulus mapping high-performance polyethylene fiber morphologies.
abstract: The data included here provides a basis for understanding "Interior morphology of high-performance polyethylene fibers revealed by modulus mapping" (K.E. Strawhecker, E.J. Sandoz-Rosado, T.A. Stockdale, E.D. Laird, 2016) [1], in specific: the multi-frequency (AMFM) atomic force microscopy technique and its application to ultra-high-molecular-weight Polyethylene (UHMWPE) fibers. Furthermore, the data suggests why the Hertzian contact mechanics model can be used within the framework of AMFM theory, simple harmonic oscillator theory, and contact mechanics. The framework is first laid out followed by data showing cantilever dynamics, force-distance spectra in AC mode, and force-distance in contact mode using Polystyrene reference and UHMWPE. Finally topography and frequency shift (stiffness) maps are presented to show the cases where elastic versus plastic deformation may have occurred.
authors.affiliation: U.S. Army Research Laboratory, RDRL-WMM-G, Aberdeen Proving Ground, MD 21005-5069, USA.
authors.forename: Kenneth E
authors.initials: KE
authors.lastname: Strawhecker
authors.affiliation: U.S. Army Research Laboratory, RDRL-WMM-G, Aberdeen Proving Ground, MD 21005-5069, USA.
authors.forename: Emil J
authors.initials: EJ
authors.lastname: Sandoz-Rosado
authors.affiliation: U.S. Army Research Laboratory, RDRL-WMM-G, Aberdeen Proving Ground, MD 21005-5069, USA.
authors.forename: Taylor A
authors.initials: TA
authors.lastname: Stockdale
authors.affiliation: U.S. Army Research Laboratory, RDRL-WMM-G, Aberdeen Proving Ground, MD 21005-5069, USA.
authors.forename: Eric D
authors.initials: ED
authors.lastname: Laird
keywords: AMFM; Atomic force microscopy; Modulus mapping; UHMWPE; Ultra-high-molecular-weight Polyethylene