title: Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy.
abstract: We have applied aberration-corrected transmission electron microscopy (TEM) imaging and electron energy loss spectroscopy (EELS) to study the structure and chemistry of epitaxial ceria thin films, grown by pulsed laser deposition onto (001) yttria-stabilized zirconia (YSZ) substrates. There are few observable defects apart from the expected mismatch interfacial dislocations and so the films would be expected to have good potential for applications. Under high electron beam dose rate (above about 6000 e-/Å2s) domains of an ordered structure appear and these are interpreted as being created by oxygen vacancy ordering. The ordered structure does not appear at lower lose rates (ca. 2600 e-/Å2s) and can be removed by imaging under 1 mbar oxygen gas in an environmental TEM. EELS confirms that there is both oxygen deficiency and the associated increase in Ce3+versus Ce4+cations in the ordered domains. In situ high resolution TEM recordings show the formation of the ordered domains as well as atomic migration along the ceria thin film (001) surface.
authors.affiliation: Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, USA. Electronic address: bobsinc@stanford.edu.
authors.forename: Robert
authors.initials: R
authors.lastname: Sinclair
authors.affiliation: Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, USA. Electronic address: sclee99@stanford.edu.
authors.forename: Sang Chul
authors.initials: SC
authors.lastname: Lee
authors.affiliation: Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, USA; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA; Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
authors.forename: Yezhou
authors.initials: Y
authors.lastname: Shi
authors.affiliation: Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, USA; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA; Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
authors.forename: William C
authors.initials: WC
authors.lastname: Chueh
keywords: Aberration-corrected TEM; Electron energy loss spectroscopy; Environmental TEM; Epitaxial ceria thin films; In situ high resolution electron microscopy; Yttria-stabilized zirconia substrates