title: Rotational scanning atomic force microscopy.
abstract: A non-raster scanning technique for atomic force microscopy (AFM) imaging which combines rotational and translational motion is presented. The use of rotational motion for the fast scan axis allows us to significantly increase the scanning speed while imaging a large area (diameter > 30 μm). An image reconstruction algorithm and the factors influencing the resolution of the technique are discussed. The experimental results show the potential of the rotational scanning technique for high-throughput large area AFM investigation.
authors.affiliation: Department of Nanoengineering, Center for Physical Sciences and Technology, Savanoriu 231, 02300 Vilnius, Lithuania.
authors.forename: A
authors.initials: A
authors.lastname: Ulčinas
authors.forename: Š
authors.initials: Š
authors.lastname: Vaitekonis