title: Correction: Liu, B., et al. Quantitative Evaluation of Pulsed Thermography, Lock-In Thermography and Vibrothermography on Foreign Object Defect (FOD) in CFRP. Sensors 2016, 16, doi:10.3390/s16050743.
abstract: n/a.
authors.affiliation: School of Information Science and Engineering, Shenyang University of Technology, 111 Shenliao West Road, Shenyang 110870, China. syuotwenwu@sina.com.
authors.forename: Bin
authors.initials: B
authors.lastname: Liu
authors.affiliation: Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, Laval University, 1065 av. de la Médecine, QC G1V 0A6, Canada. hai.zhang.1@ulaval.ca.
authors.forename: Hai
authors.initials: H
authors.lastname: Zhang
authors.affiliation: Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, Laval University, 1065 av. de la Médecine, QC G1V 0A6, Canada. henrique-coelho.fernandes.1@ulaval.ca.|Department of Mechanical Engineering, Federal University of Uberlandia, 2121 Av. Joao Naves de Avila, Uberlandia 38400-902, Brazil. henrique-coelho.fernandes.1@ulaval.ca.
authors.forename: Henrique
authors.initials: H
authors.lastname: Fernandes
authors.affiliation: Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, Laval University, 1065 av. de la Médecine, QC G1V 0A6, Canada. xavier.maldague@gel.ulaval.ca.
authors.forename: Xavier
authors.initials: X
authors.lastname: Maldague