title: Design of Interrogation Protocols for Radiation Dose Measurements Using Optically-Stimulated Luminescent Dosimeters.
abstract: Optically-stimulated luminescent dosimeters are capable of being interrogated multiple times post-irradiation. Each interrogation removes a fraction of the signal stored within the optically-stimulated luminescent dosimeter. This signal loss must be corrected to avoid systematic errors in estimating the average signal of a series of optically-stimulated luminescent dosimeter interrogations and requires a minimum number of consecutive readings to determine an average signal that is within a desired accuracy of the true signal with a desired statistical confidence. This paper establishes a technical basis for determining the required number of readings for a particular application of these dosimeters when using certain OSL dosimetry systems.
authors.affiliation: *University of Michigan, Department of Nuclear Engineering and Radiological Sciences, Ann Arbor, MI 48109-2104; †Department of Physics, University of Azad Jammu and Kashmir, Muzaffarabad, Azad Kashmir 13100, Pakistan; ‡College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, Hunan Province, China.
authors.forename: Sara A
authors.initials: SA
authors.lastname: Abraham
authors.forename: Kimberlee J
authors.initials: KJ
authors.lastname: Kearfott
authors.forename: Ali H
authors.initials: AH
authors.lastname: Jawad
authors.forename: Andrew J
authors.initials: AJ
authors.lastname: Boria
authors.forename: Tobias J
authors.initials: TJ
authors.lastname: Buth
authors.forename: Alexander S
authors.initials: AS
authors.lastname: Dawson
authors.forename: Sheldon C
authors.initials: SC
authors.lastname: Eng
authors.forename: Samuel J
authors.initials: SJ
authors.lastname: Frank
authors.forename: Crystal A
authors.initials: CA
authors.lastname: Green
authors.forename: Mitchell L
authors.initials: ML
authors.lastname: Jacobs
authors.forename: Kevin
authors.initials: K
authors.lastname: Liu
authors.forename: Joseph A
authors.initials: JA
authors.lastname: Miklos
authors.forename: Hien
authors.initials: H
authors.lastname: Nguyen
authors.forename: Muhammad
authors.initials: M
authors.lastname: Rafique
authors.forename: Blake D
authors.initials: BD
authors.lastname: Rucinski
authors.forename: Travis
authors.initials: T
authors.lastname: Smith
authors.forename: Yanliang
authors.initials: Y
authors.lastname: Tan
mesh_terms: D016477:Artifacts; D002138:Calibration / Q000592:standards; D004867:Equipment Design; D019544:Equipment Failure Analysis; D017408:Guidelines as Topic; D008029:Lighting / Q000295:instrumentation / Q000592:standards*; D055096:Optical Devices / Q000592:standards*; D011829:Radiation Dosage; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity; D013819:Thermoluminescent Dosimetry / Q000295:instrumentation* / Q000592:standards*