title: Reduction of radiation loss at small-radius bend using spoof surface plasmon polariton transmission line.
abstract: Spoof surface plasmon polariton (SPP) has been realized at low frequencies through corrugated metallic structures. As two-dimensional application, the ultrathin SPP transmission lines (TLs) have been proposed with great potentials for microwave compact circuits due to the strong field confinement and enhancement, as well as controllable dispersive properties. In this paper, we examine the radiation loss at small-radius bend, which may cause severe crosstalk in highly-integrated circuits or systems, for the SPP TLs. We theoretically analyze that the SPP TL has essential merit of low radiation loss, and show better performance of SPP TL than the conventional microstrip line through numerical simulations and experiments. Both simulated and measured results demonstrate that the new type of transmission line can efficiently suppress the radiation loss at small-radius bend, and hence reduce the crosstalk in circuits and systems.
authors.affiliation: State Key Laboratory of Millimetre Waves, School of Information Science and Engineering, Southeast University, Nanjing 210096, China.
authors.forename: Wen Xuan
authors.initials: WX
authors.lastname: Tang
authors.affiliation: State Key Laboratory of Millimetre Waves, School of Information Science and Engineering, Southeast University, Nanjing 210096, China.
authors.forename: Hao Chi
authors.initials: HC
authors.lastname: Zhang
authors.affiliation: State Key Laboratory of Millimetre Waves, School of Information Science and Engineering, Southeast University, Nanjing 210096, China.
authors.forename: Jun Feng
authors.initials: JF
authors.lastname: Liu
authors.affiliation: State Key Laboratory of Millimetre Waves, School of Information Science and Engineering, Southeast University, Nanjing 210096, China.
authors.forename: Jie
authors.initials: J
authors.lastname: Xu
authors.affiliation: State Key Laboratory of Millimetre Waves, School of Information Science and Engineering, Southeast University, Nanjing 210096, China.
authors.forename: Tie Jun
authors.initials: TJ
authors.lastname: Cui