title: Simultaneous measurement of refractive index and thickness of multilayer systems using Fourier domain optical coherence tomography, part 1: theory.
abstract: We introduce a theoretical framework for simultaneous refractive index and thickness measurement of multilayer systems using the Fourier domain optical coherence tomography (FD-OCT) system without any previous information about the item under investigation. The input data to the new formalism are the FD-OCT measured optical path lengths and properly selected spectral components of the FD-OCT interference spectrum. No additional arrangement, reference reflector, or mechanical scanning is needed in this approach. Simulation results show that the accuracy of the extracted parameters depends on the index contrast of the sample while it is insensitive to the sample’s thickness profile. For transparent biological samples with smooth interfaces, when the object is in an aqueous medium and has indices < 1.55 , this method can extract indices and thicknesses with the absolute error ? 0.001 .
authors.affiliation: University of Ottawa, Physics Department, 150 Louis Pasteur, Ottawa, Ontario K1N 6N5, Canada.
authors.forename: Payman
authors.initials: P
authors.lastname: Rajai
authors.affiliation: University of Ottawa, Physics Department, 150 Louis Pasteur, Ottawa, Ontario K1N 6N5, CanadabUniversity of Ottawa, School of Electrical Engineering and Computer Science, Ottawa, Ontario K1N 6N5, Canada.
authors.forename: Henry
authors.initials: H
authors.lastname: Schriemer
authors.affiliation: Sharif University of Technology, Physics Department, P.O. Box: 11155-9161, Tehran, Iran.
authors.forename: Ahmad
authors.initials: A
authors.lastname: Amjadi
authors.affiliation: University of Ottawa, Physics Department, 150 Louis Pasteur, Ottawa, Ontario K1N 6N5, Canada.
authors.forename: Rejean
authors.initials: R
authors.lastname: Munger
mesh_terms: D005583:Fourier Analysis; D012031:Refractometry; D041623:Tomography, Optical Coherence