An Automated Reverse-Bias Second-Breakdown Transistor Tester.
An automated instrument is described for generating curves for the reverse-bias, safe-operating area of transistors nondestructively. A new technique for detecting second breakdown that makes automation possible is highlighted. Methods to reduce stress to the device under test are discussed, as are several other innovations that enhance automation. Measurements using the tester are described, and limitations on nondestructive testability are discussed.
National Institute of Standards and Technology, Gaithersburg, MD 20899.
David
D
Berning
automated testing; clamp overshoot; crowbar; fast switching; nondestructive; protection circuit; reversebias; safe-operating area; second breakdown; transistor