Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations.
The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium. Electronic address: nick.schryvers@uantwerpen.be.
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D
Schryvers
Department of Earth Sciences, University of Cambridge, Cambridge CB2 3EQ, UK.
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EKH
Salje
Department of Engineering Sciences for Electronics and Materials, Faculty of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816-8580, Japan.
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M
Nishida
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.
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A
De Backer
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium; Institute of Mechanics, Materials and Civil Engineering, Université Catholique de Louvain, Place Sainte Barbe, 2, B-1348, Louvain-la-Neuve, Belgium.
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Idrissi
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.
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Van Aert
Aberration correction; Alloys; Oxides; Phase transformation; Pico; Quantification