Ultrahigh-resolution imaging of water networks by atomic force microscopy.
Local defects in water layers growing on metal surfaces have a key influence on the wetting process at the surfaces; however, such minor structures are undetectable by macroscopic methods. Here, we demonstrate ultrahigh-resolution imaging of single water layers on a copper(110) surface by using non-contact atomic force microscopy (AFM) with molecular functionalized tips at 4.8 K. AFM with a probe tip terminated by carbon monoxide predominantly images oxygen atoms, whereas the contribution of hydrogen atoms is modest. Oxygen skeletons in the AFM images reveal that the water networks containing local defects and edges are composed of pentagonal and hexagonal rings. The results reinforce the applicability of AFM to characterize atomic structures of weakly bonded molecular assemblies.
Department of Advanced Materials Science, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa 277-8561, Japan.
Akitoshi
A
Shiotari
Department of Advanced Materials Science, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa 277-8561, Japan.
Yoshiaki
Y
Sugimoto