Software Techniques to Improve Data Reliability in Superconductor and Low-Resistance Measurements.
Software techniques have been developed to take low-amplitude data in various patterns, assign a figure of merit to a set of data readings, edit data for erroneous readings (or other experimental variations), and to alert the experimenter if the detected errors are beyond the scope of the software. Erroneous voltage readings from digital voltmeters, intermittent electrical connections, and an array of similar variations in data have been detected through the use of a data editor. The fixed-limit data editor removes readings that are inconsistent with the distribution of the majority of the data readings. The frequency of erroneous readings from a particular digital voltmeter ranges from 1 error per 100 000 readings to 1 error per 100 readings. The magnitude of the error can be as large as 3% of full scale with a zero volt input to the voltmeter. It may be necessary to have multiple meters measuring voltages in the same circuit in order to generate these erroneous readings. A systematic study was performed on the occurrence of the internally-generated erroneous voltmeter readings, and it was determined that the amount that a reading was in error scaled with one of a few parameters. The software techniques described here have been used in a variety of measurements, such as resistance-versus-temperature measurements made on cryoconductors or superconductors, and voltage-versus-current measurements made on superconductors to determine the critical current.
National Institute of Standards and Technology, Boulder, CO 80303.
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Goodrich
National Institute of Standards and Technology, Boulder, CO 80303.
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Srivastava
critical current; cryoconductor; editor; errors; figure of merit; measurement system; outlier; resistivity; software; statistics; superconductor