title: Simulated photoelectron intensities at the aqueous solution-air interface for flat and cylindrical (microjet) geometries.
abstract: Ion spatial distributions at the aqueous-air/vacuum interface are accessible by energy-dependent X-ray photoelectron spectroscopy (XPS). Here we quantify the difference between a flat surface and a cylindrical microjet in terms of the energy-dependent information depth of the XPS experiment and in terms of the simulated photoelectron intensities using solutions of pure water and of 1 mol L-1NaI as examples.
authors.affiliation: Laboratory for Surface Science and Technology, Department of Materials, ETH Zürich, Switzerland. matthew.brown@mat.ethz.ch.
authors.forename: Giorgia
authors.initials: G
authors.lastname: Olivieri
authors.affiliation: Department of Chemistry, University of California, Irvine, California, USA.
authors.forename: Krista M
authors.initials: KM
authors.lastname: Parry
authors.affiliation: Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland, USA.
authors.forename: Cedric J
authors.initials: CJ
authors.lastname: Powell
authors.affiliation: Department of Chemistry, University of California, Irvine, California, USA.
authors.forename: Douglas J
authors.initials: DJ
authors.lastname: Tobias
authors.affiliation: Laboratory for Surface Science and Technology, Department of Materials, ETH Zürich, Switzerland. matthew.brown@mat.ethz.ch.
authors.forename: Matthew A
authors.identifier: http://orcid.org/0000-0002-5266-017X
authors.initials: MA
authors.lastname: Brown