title: Tin Oxide Crystals Exposed by Low-Energy {110} Facets for Enhanced Electrochemical Heavy Metal Ions Sensing: X-ray Absorption Fine Structure Experimental Combined with Density-Functional Theory Evidence.
abstract: Herein, we revealed that the electrochemical behaviors on the detection of heavy metal ions (HMIs) would largely rely on the exposed facets of SnO2nanoparticles. Compared to the high-energy {221} facet, the low-energy {110} facet of SnO2possessed better electrochemical performance. The adsorption/desorption tests, density-functional theory (DFT) calculations, and X-ray absorption fine structure (XAFS) studies showed that the lower barrier energy of surface diffusion on {110} facet was critical for the superior electrochemical property, which was favorable for the ions diffusion on the electrode, and further leading the enhanced electrochemical performance. Through the combination of experiments and theoretical calculations, a reliable interpretation of the mechanism for electroanalysis of HMIs with nanomaterials exposed by different crystal facets has been provided. Furthermore, it provides a deep insight into understanding the key factor to improve the electrochemical performance for HMIs detection, so as to design high-performance electrochemical sensors.
authors.affiliation: Institute of Intelligent Machines, Chinese Academy of Sciences , Hefei 230031, PR China.
authors.forename: Zhen
authors.initials: Z
authors.lastname: Jin
authors.affiliation: Institute of Intelligent Machines, Chinese Academy of Sciences , Hefei 230031, PR China.|Department of Materials Science and Engineering, University of Science and Technology of China , Hefei 230026, PR China.
authors.forename: Meng
authors.initials: M
authors.lastname: Yang
authors.affiliation: Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China , Hefei 230026, PR China.
authors.forename: Shao-Hua
authors.initials: SH
authors.lastname: Chen
authors.affiliation: Institute of Intelligent Machines, Chinese Academy of Sciences , Hefei 230031, PR China.
authors.forename: Jin-Huai
authors.initials: JH
authors.lastname: Liu
authors.affiliation: Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China , Hefei 230026, PR China.
authors.forename: Qun-Xiang
authors.initials: QX
authors.lastname: Li
authors.affiliation: Institute of Intelligent Machines, Chinese Academy of Sciences , Hefei 230031, PR China.|Department of Materials Science and Engineering, University of Science and Technology of China , Hefei 230026, PR China.
authors.forename: Xing-Jiu
authors.identifier: 0000-0002-0395-4892
authors.initials: XJ
authors.lastname: Huang