title: Atomic resolution imaging of YAlO3: Ce in the chromatic and spherical aberration corrected PICO electron microscope.
abstract: The application of combined chromatic and spherical aberration correction in high-resolution transmission electron microscopy enables a significant improvement of the spatial resolution down to 50 pm. We demonstrate that such a resolution can be achieved in practice at 200kV. Diffractograms of images of gold nanoparticles on amorphous carbon demonstrate corresponding information transfer. The Y atom pairs in [010] oriented yttrium orthoaluminate are successfully imaged together with the Al and the O atoms. Although the 57 pm pair separation is well demonstrated separations between 55 pm and 80 pm are measured. This observation is tentatively attributed to structural relaxations and surface reconstruction in the very thin samples used. Quantification of the resolution limiting effective image spread is achieved based on an absolute match between experimental and simulated image intensity distributions.
authors.affiliation: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.
authors.forename: Lei
authors.initials: L
authors.lastname: Jin
authors.affiliation: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.; Central Facility for Electron Microscopy, RWTH Aachen University, 52074 Aachen, Germany.
authors.forename: Juri
authors.initials: J
authors.lastname: Barthel
authors.affiliation: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.; School of Electronic and Information Engineering and State Key Laboratory for Mechanical Behaviour of Materials, Xi'an Jiaotong University, Xi'an 710049, China.
authors.forename: Chun-Lin
authors.initials: CL
authors.lastname: Jia
authors.affiliation: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.; School of Electronic and Information Engineering and State Key Laboratory for Mechanical Behaviour of Materials, Xi'an Jiaotong University, Xi'an 710049, China.. Electronic address: k.urban@fz-juelich.de.
authors.forename: Knut W
authors.initials: KW
authors.lastname: Urban
keywords: Aberration correction; Absolute contrast matching; High-resolution transmission electron microscopy; Image simulation; Information limit