title: Corrected Kondo temperature beyond the conventional Kondo scaling limit.
abstract: In the Kondo systems such as the magnetic impurity screened by the conduction electrons in a metal host, as well as the quantum dots connected by the leads, the low energy behaviors have universal dependence on the [Formula: see text] or [Formula: see text], where [Formula: see text] is the conventional Kondo temperature. However, it was shown that this scaling behavior is only valid at low-energy; this is called the Kondo scaling limit. Here we explore the extention of the scaling parameter range by introducing the corrected Kondo temperature TK, which may depend on the temperature and bias, as well as the other external parameters. We define the corrected Kondo temperature by scaling the local density of states near the Fermi level, obtained by accurate hierarchy of equations of motion approach at finite temperature and finite bias, and thus obtain a phenomenological expression of the corrected Kondo temperature. By using the corrected Kondo temperature as a characteristic energy scale, the conductance of the quantum dot can be well scaled in a wide parameter range, even two orders beyond the conventional scaling parameter range. Our work indicates that the Kondo scaling, although dominated by the conventional Kondo temperature in the low-energy of the Kondo system, could be extended to a higher energy regime, which is useful for analyzing the physics of the Kondo transport in non-equilibrium or high temperature cases.
authors.affiliation: Beijing Computational Science Research Center, Beijing 100193, People's Republic of China. Department of Physics, Renmin University of China, Beijing 100872, People's Republic of China.
authors.forename: ZhenHua
authors.initials: Z
authors.lastname: Li
authors.forename: JianHua
authors.initials: J
authors.lastname: Wei
authors.forename: Xiao
authors.initials: X
authors.lastname: Zheng
authors.forename: YiJing
authors.initials: Y
authors.lastname: Yan
authors.forename: Hong-Gang
authors.initials: HG
authors.lastname: Luo