title: Shutterless ion mobility spectrometer with fast pulsed electron source.
abstract: Ion mobility spectrometers (IMS) are devices for fast and very sensitive trace gas analysis. The measuring principle is based on an initial ionization process of the target analyte. Most IMS employ radioactive electron sources, such as63Ni or3H. These radioactive materials have the disadvantage of legal restrictions and the electron emission has a predetermined intensity and cannot be controlled or disabled. In this work, we replaced the3H source of our IMS with 100 mm drift tube length with our nonradioactive electron source, which generates comparable spectra to the3H source. An advantage of our emission current controlled nonradioactive electron source is that it can operate in a fast pulsed mode with high electron intensities. By optimizing the geometric parameters and developing fast control electronics, we can achieve very short electron emission pulses for ionization with high intensities and an adjustable pulse width of down to a few nanoseconds. This results in small ion packets at simultaneously high ion densities, which are subsequently separated in the drift tube. Normally, the required small ion packet is generated by a complex ion shutter mechanism. By omitting the additional reaction chamber, the ion packet can be generated directly at the beginning of the drift tube by our pulsed nonradioactive electron source with only slight reduction in resolving power. Thus, the complex and costly shutter mechanism and its electronics can also be omitted, which leads to a simple low-cost IMS-system with a pulsed nonradioactive electron source and a resolving power of 90.
authors.affiliation: Department of Sensors and Measurement Technology, Institute of Electrical Engineering and Measurement Technology, Leibniz Universität Hannover, Appelstr. 9a, 30167 Hannover, Germany.
authors.forename: E
authors.identifier: 0000000284125809
authors.initials: E
authors.lastname: Bunert
authors.affiliation: Department of Sensors and Measurement Technology, Institute of Electrical Engineering and Measurement Technology, Leibniz Universität Hannover, Appelstr. 9a, 30167 Hannover, Germany.
authors.forename: A
authors.initials: A
authors.lastname: Heptner
authors.affiliation: Department of Sensors and Measurement Technology, Institute of Electrical Engineering and Measurement Technology, Leibniz Universität Hannover, Appelstr. 9a, 30167 Hannover, Germany.
authors.forename: T
authors.initials: T
authors.lastname: Reinecke
authors.affiliation: Department of Sensors and Measurement Technology, Institute of Electrical Engineering and Measurement Technology, Leibniz Universität Hannover, Appelstr. 9a, 30167 Hannover, Germany.
authors.forename: A T
authors.identifier: 0000000171523077
authors.initials: AT
authors.lastname: Kirk
authors.affiliation: Department of Sensors and Measurement Technology, Institute of Electrical Engineering and Measurement Technology, Leibniz Universität Hannover, Appelstr. 9a, 30167 Hannover, Germany.
authors.forename: S
authors.initials: S
authors.lastname: Zimmermann