title: Report on the CCT Supplementary Comparison S1 of Infrared Spectral Normal Emittance/Emissivity.
abstract: The National Measurement Institutes (NMIs) of the United States, Germany, France, Italy and Japan, have joined in an inter-laboratory comparison of their infrared spectral emittance scales. This action is part of a series of supplementary inter-laboratory comparisons (including thermal conductivity and thermal diffusivity) sponsored by the Consultative Committee on Thermometry (CCT) Task Group on Thermophysical Quantities (TG-ThQ). The objective of this collaborative work is to strengthen the major operative National Measurement Institutes' infrared spectral emittance scales and consequently the consistency of radiative properties measurements carried out worldwide. The comparison has been performed over a spectral range of 2 μm to 14 μm, and a temperature range from 23 °C to 800 °C. Artefacts included in the comparison are potential standards: oxidized inconel, boron nitride, and silicon carbide. The measurement instrumentation and techniques used for emittance scales are unique for each NMI, including the temperature ranges covered as well as the artefact sizes required. For example, all three common types of spectral instruments are represented: dispersive grating monochromator, Fourier transform and filter-based spectrometers. More than 2000 data points (combinations of material, wavelength and temperature) were compared. Ninety-eight percent (98%) of the data points were in agreement, with differences to weighted mean values less than the expanded uncertainties calculated from the individual NMI uncertainties and uncertainties related to the comparison process.
authors.affiliation: National Institute of Standards and Technology (NIST), Sensor Science Division, Gaithersburg, MD, USA.
authors.forename: Leonard
authors.initials: L
authors.lastname: Hanssen
authors.affiliation: National Institute of Standards and Technology (NIST), Sensor Science Division, Gaithersburg, MD, USA; currently with NIST, Applied Chemical and Materials Division, Boulder, CO, USA.
authors.forename: B
authors.initials: B
authors.lastname: Wilthan
authors.affiliation: Physikalisch-Technische Bundesanstalt (PTB), Temperature and Synchrotron Divison, Berlin, Germany.
authors.forename: Christian
authors.initials: C
authors.lastname: Monte
authors.affiliation: Physikalisch-Technische Bundesanstalt (PTB), Temperature and Synchrotron Divison, Berlin, Germany.
authors.forename: Jörg
authors.initials: J
authors.lastname: Hollandt
authors.affiliation: Laboratoire National de Métrologie et d'Essais (LNE), Photonics and Energy Division, Trappes, France.
authors.forename: Jacques
authors.initials: J
authors.lastname: Hameury
authors.affiliation: Laboratoire National de Métrologie et d'Essais (LNE), Photonics and Energy Division, Trappes, France.
authors.forename: Jean-Remy
authors.initials: JR
authors.lastname: Filtz
authors.affiliation: Instituto Nazionale di Ricerca Metrologica (INRIM), Division of Metrology for Quality of Life, Torino, Italy.
authors.forename: Ferruccio
authors.initials: F
authors.lastname: Girard
authors.affiliation: Instituto Nazionale di Ricerca Metrologica (INRIM), Division of Metrology for Quality of Life, Torino, Italy.
authors.forename: Mauro
authors.initials: M
authors.lastname: Battuello
authors.affiliation: National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan.
authors.forename: Juntaro
authors.initials: J
authors.lastname: Ishii
keywords: Comparison; Emissivity; Emittance; Infrared; Spectral; Standards