title: Improving the spatial and statistical accuracy in X-ray Raman scattering based direct tomography.
abstract: An algorithm to simultaneously increase the spatial and statistical accuracy of X-ray Raman scattering (XRS) based tomographic images is presented. Tomography that utilizes XRS spectroscopy signals as a contrast for the images is a new and promising tool for investigating local atomic structure and chemistry in heterogeneous samples. The algorithm enables the spatial resolution to be increased based on a deconvolution of the optical response function of the spectrometer and, most importantly, it allows for the combination of data collected from multiple analyzers and thus enhances the statistical accuracy of the measured images.
authors.affiliation: European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France.
authors.forename: Ch J
authors.initials: CJ
authors.lastname: Sahle
authors.affiliation: European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France.
authors.forename: A
authors.initials: A
authors.lastname: Mirone
authors.affiliation: European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France.
authors.forename: T
authors.initials: T
authors.lastname: Vincent
authors.affiliation: Department of Physics, University of Helsinki, POB 64, FI-00014 Helsinki, Finland.
authors.forename: A
authors.initials: A
authors.lastname: Kallonen
authors.affiliation: Department of Physics, University of Helsinki, POB 64, FI-00014 Helsinki, Finland.
authors.forename: S
authors.initials: S
authors.lastname: Huotari
keywords: XRS; direct tomography; imaging; inelastic X-ray scattering