title: Interfacial defects induced electronic property transformation at perovskite SrVO3/SrTiO3and LaCrO3/SrTiO3heterointerfaces.
abstract: Unravelling the atomic structure and chemical species of interfacial defects is critical to understanding the origin of interfacial properties in many heterojunctions. Here, by combining advanced transmission electron microscopy, spectroscopy and first-principles calculations, we demonstrate interfacial Ti diffusion in SrVO3/SrTiO3and LaCrO3/SrTiO3heterointerfaces and uncover that the interfacial defects induce a significant change in electronic properties by showing an electronic transformation from the insulating state to metallic state at SrVO3/SrTiO3heterointerfaces due to the hybridization of interfacial Ti d, O p and V d, and a metallic to insulating state transformation at LaCrO3/SrTiO3because of Ti-Cr mixing induced charge redistribution in the interfacial layer.
authors.affiliation: Engineering Research Center for Nanophotonics and Advanced Instrument, Ministry of Education, Department of Physics, East China Normal University, North Zhongshan Road 3663, Shanghai 200062, China.
authors.forename: Junjie
authors.initials: J
authors.lastname: Li
authors.affiliation: School of Manufacturing Science and Engineering, Sichuan University, Chengdu 610064, China.
authors.forename: Deqiang
authors.initials: D
authors.lastname: Yin
authors.affiliation: School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China.
authors.forename: Qiang
authors.initials: Q
authors.lastname: Li
authors.affiliation: Institute of Engineering Innovation, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan.
authors.forename: Rong
authors.initials: R
authors.lastname: Sun
authors.affiliation: Engineering Research Center for Nanophotonics and Advanced Instrument, Ministry of Education, Department of Physics, East China Normal University, North Zhongshan Road 3663, Shanghai 200062, China.
authors.forename: Sumei
authors.identifier: http://orcid.org/0000-0001-5283-3918
authors.initials: S
authors.lastname: Huang
authors.affiliation: School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China. fzmeng@cust.edu.cn.
authors.forename: Fanzhi
authors.identifier: http://orcid.org/0000-0002-0599-015X
authors.initials: F
authors.lastname: Meng