title: Study on the reflectivity properties of spherically bent analyser crystals. Corrigendum.
abstract: Corrections to the paper by Honkanen et al. (2014). [J. Synchrotron Rad. 21, 104-110] are made.
authors.affiliation: Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.
authors.forename: Ari Pekka
authors.initials: AP
authors.lastname: Honkanen
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors.forename: Roberto
authors.initials: R
authors.lastname: Verbeni
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors.forename: Laura
authors.initials: L
authors.lastname: Simonelli
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors.forename: Marco
authors.initials: M
authors.lastname: Moretti Sala
authors.affiliation: European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
authors.forename: Giulio
authors.initials: G
authors.lastname: Monaco
authors.affiliation: Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.
authors.forename: Simo
authors.initials: S
authors.lastname: Huotari
keywords: bent crystals; high-energy-resolution analysers; inelastic X-ray scattering