title: Determination of Surface Recombination Velocities at Contacts in Organic Semiconductor Devices Using Injected Carrier Reservoirs.
abstract: A method to determine surface recombination velocities at collecting contacts in interface-limited organic semiconductor devices, based on the extraction of injected carrier reservoirs in a single-carrier sandwich-type structure, is presented. The analytical framework is derived and verified with drift-diffusion simulations. The method is demonstrated on solution-processed organic semiconductor devices with hole-blocking TiO_{2}/organic and SiO_{2}/organic interfaces, relevant for solar cell and transistor applications, respectively.
authors.affiliation: Center for Functional Materials and Faculty of Science and Technology, Åbo Akademi University, Porthaninkatu 3, 20500 Turku, Finland.
authors.forename: Oskar J
authors.initials: OJ
authors.lastname: Sandberg
authors.affiliation: Center for Functional Materials and Faculty of Science and Technology, Åbo Akademi University, Porthaninkatu 3, 20500 Turku, Finland.
authors.forename: Simon
authors.initials: S
authors.lastname: Sandén
authors.affiliation: Center for Functional Materials and Faculty of Science and Technology, Åbo Akademi University, Porthaninkatu 3, 20500 Turku, Finland.
authors.forename: Anton
authors.initials: A
authors.lastname: Sundqvist
authors.affiliation: Center for Functional Materials and Faculty of Science and Technology, Åbo Akademi University, Porthaninkatu 3, 20500 Turku, Finland.
authors.forename: Jan-Henrik
authors.initials: JH
authors.lastname: Smått
authors.affiliation: Center for Functional Materials and Faculty of Science and Technology, Åbo Akademi University, Porthaninkatu 3, 20500 Turku, Finland.
authors.forename: Ronald
authors.initials: R
authors.lastname: Österbacka