title: An attribute control chart for a Weibull distribution under accelerated hybrid censoring.
abstract: In this article, an attribute control chart has been proposed using the accelerated hybrid censoring logic for the monitoring of defective items whose life follows a Weibull distribution. The product can be tested by introducing the acceleration factor based on different pressurized conditions such as stress, load, strain, temperature, etc. The control limits are derived based on the binomial distribution, but the fraction defective is expressed only through the shape parameter, the acceleration factor and the test duration constant. Tables of the average run lengths have been generated for different process parameters to assess the performance of the proposed control chart. Simulation studies have been performed for the practical use, where the proposed chart is compared with the Shewhart np chart for demonstration of the detection power of a process shift.
authors.affiliation: Department of Statistics, Faculty of Science, King Abdulaziz University, Jeddah, Saudi Arabia.
authors.forename: Muhammad
authors.initials: M
authors.lastname: Aslam
authors.affiliation: Department of Statistics, Faculty of Science, King Abdulaziz University, Jeddah, Saudi Arabia.
authors.forename: Osama H
authors.initials: OH
authors.lastname: Arif
authors.affiliation: Department of Industrial and Management Engineering, POSTECH, Pohang, Republic of Korea.
authors.forename: Chi-Hyuck
authors.initials: CH
authors.lastname: Jun
mesh_terms: D000465:Algorithms; D016010:Binomial Distribution; D008962:Models, Theoretical; D011786:Quality Control; D012666:Semiconductors