title: Reflections on the value of electron microscopy in the study of heterogeneous catalysts.
abstract: Electron microscopy (EM) is arguably the single most powerful method of characterizing heterogeneous catalysts. Irrespective of whether they are bulk and multiphasic, or monophasic and monocrystalline, or nanocluster and even single-atom and on a support, their structures in atomic detail can be visualized in two or three dimensions, thanks to high-resolution instruments, with sub-Ångstrom spatial resolutions. Their topography, tomography, phase-purity, composition, as well as the bonding, and valence-states of their constituent atoms and ions and, in favourable circumstances, the short-range and long-range atomic order and dynamics of the catalytically active sites, can all be retrieved by the panoply of variants of modern EM. The latter embrace electron crystallography, rotation and precession electron diffraction, X-ray emission and high-resolution electron energy-loss spectra (EELS). Aberration-corrected (AC) transmission (TEM) and scanning transmission electron microscopy (STEM) have led to a revolution in structure determination. Environmental EM is already playing an increasing role in catalyst characterization, and new advances, involving special cells for the study of solid catalysts in contact with liquid reactants, have recently been deployed.
authors.affiliation: Department of Materials Science and Metallurgy , University of Cambridge , 27 Charles Babbage Road, Cambridge CB3 0FS , UK.
authors.forename: John Meurig
authors.identifier: 0000-0003-1147-8838
authors.initials: JM
authors.lastname: Thomas
keywords: composition; electron crystallography; electron tomography; nanomaterials; selective oxidation catalysts; structure; zeolites