title: En facecoherence microscopy [Invited].
abstract: En facecoherence microscopy or flying spot or full field optical coherence tomography or microscopy (FF-OCT/FF-OCM) belongs to the OCT family because the sectioning ability is mostly linked to the source coherence length. In this article we will focus our attention on the advantages and the drawbacks of the following approaches:en faceversus B scan tomography in terms of resolution, coherent versus incoherent illumination and influence of aberrations, and scanning versus full field imaging. We then show some examples to illustrate the diverse applications ofen facecoherent microscopy and show that endogenous or exogenous contrasts can add valuable information to the standard morphological image. To conclude we discuss a few domains that appear promising for future development ofen facecoherence microscopy.
authors.affiliation: Institut Langevin ESPCI, PSL Research University, CNRS UMR7587 1rue Jussieu, Paris F75005, France.
authors.forename: Olivier
authors.initials: O
authors.lastname: Thouvenin
authors.affiliation: CHNO des Quinze Vingts/Institut de la Vision, 28 rue de Charenton, Paris F75012, France.
authors.forename: Kate
authors.initials: K
authors.lastname: Grieve
authors.affiliation: Institut Langevin ESPCI, PSL Research University, CNRS UMR7587 1rue Jussieu, Paris F75005, France.
authors.forename: Peng
authors.initials: P
authors.lastname: Xiao
authors.affiliation: Institut Langevin ESPCI, PSL Research University, CNRS UMR7587 1rue Jussieu, Paris F75005, France; LLTech Pépinière Paris Santé Cochin 29 rue du Faubourg Saint Jacques Paris F75014, France.
authors.forename: Clement
authors.initials: C
authors.lastname: Apelian
authors.affiliation: Institut Langevin ESPCI, PSL Research University, CNRS UMR7587 1rue Jussieu, Paris F75005, France.
authors.forename: A Claude
authors.initials: AC
authors.lastname: Boccara
keywords: (120.5820) Scattering measurements; (170.1650) Coherence imaging; (170.4580) Optical diagnostics for medicine; (180.1655) Coherence tomography; (180.3170) Interference microscopy