title: Evaluation of noise limits to improve image processing in soft X-ray projection microscopy.
abstract: Soft X-ray microscopy has been developed for high resolution imaging of hydrated biological specimens due to the availability of water window region. In particular, a projection type microscopy has advantages in wide viewing area, easy zooming function and easy extensibility to computed tomography (CT). The blur of projection image due to the Fresnel diffraction of X-rays, which eventually reduces spatial resolution, could be corrected by an iteration procedure, i.e., repetition of Fresnel and inverse Fresnel transformations. However, it was found that the correction is not enough to be effective for all images, especially for images with low contrast. In order to improve the effectiveness of image correction by computer processing, we in this study evaluated the influence of background noise in the iteration procedure through a simulation study. In the study, images of model specimen with known morphology were used as a substitute for the chromosome images, one of the targets of our microscope. Under the condition that artificial noise was distributed on the images randomly, we introduced two different parameters to evaluate noise effects according to each situation where the iteration procedure was not successful, and proposed an upper limit of the noise within which the effective iteration procedure for the chromosome images was possible. The study indicated that applying the new simulation and noise evaluation method was useful for image processing where background noises cannot be ignored compared with specimen images.
authors.affiliation: Graduate School of Advanced Integration Science, Chiba University, Chiba-shi, Chiba, Japan.
authors.forename: Erdenetogtokh
authors.initials: E
authors.lastname: Jamsranjav
authors.affiliation: Graduate School of Advanced Integration Science, Chiba University, Chiba-shi, Chiba, Japan.
authors.forename: Kenichi
authors.initials: K
authors.lastname: Kuge
authors.affiliation: School of Engineering, Tokai University, Hiratsuka-shi, Kanagawa, Japan.
authors.forename: Atsushi
authors.initials: A
authors.lastname: Ito
authors.affiliation: Tokyo Metropolitan Industrial Technol. Res. Inst., Koto-ku, Tokyo, Japan.
authors.forename: Yasuhito
authors.initials: Y
authors.lastname: Kinjo
authors.affiliation: Graduate School of Advanced Integration Science, Chiba University, Chiba-shi, Chiba, Japan.
authors.forename: Tatsuo
authors.initials: T
authors.lastname: Shiina
keywords: Soft X-ray; iteration procedure; noise evaluation; projection microscopy