title: Manipulating low-dimensional materials down to the level of single atoms with electron irradiation.
abstract: Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual atoms. Here we discuss the dynamics that are observed in the structure of low-dimensional materials under electron irradiation, and the potential use of electron beams for single-atom manipulation. As a demonstration of the latter capability, we show how momentum transfer from the electrons of a 60-keV Ångström-sized STEM probe can be used to move silicon atoms embedded in the graphene lattice with atomic precision.
authors.affiliation: Faculty of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria. Electronic address: toma.susi@univie.ac.at.
authors.forename: Toma
authors.initials: T
authors.lastname: Susi
authors.affiliation: Faculty of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria. Electronic address: jannik.meyer@univie.ac.at.
authors.forename: Jannik C
authors.initials: JC
authors.lastname: Meyer
authors.affiliation: Faculty of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria. Electronic address: jani.kotakoski@univie.ac.at.
authors.forename: Jani
authors.initials: J
authors.lastname: Kotakoski
keywords: 2D materials; Scanning transmission electron microscopy; electron irradiation effects; single atom manipulation