title: Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data.
abstract: Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater detail. For the first time, the accuracy of crystallographic measurements made using APT will be independently verified using TKD. Experimental data from two atom probe tips, one a nanocrystalline Al-0.5Ag alloy specimen collected on a straight flight-path atom probe and the other a high purity Mo specimen collected on a reflectron-fitted instrument, will be compared. We find that the average minimum misorientation angle, calculated from calibrated atom probe reconstructions with two different pole combinations, deviate 0.7° and 1.4°, respectively, from the TKD results. The type of atom probe and experimental conditions appear to have some impact on this accuracy and the reconstruction and measurement procedures are likely to contribute further to degradation in angular resolution. The challenges and implications of this correlative approach will also be discussed.
authors.affiliation: 1Australian Centre for Microscopy and Microanalysis,The University of Sydney,Sydney,NSW 2006,Australia.
authors.forename: Andrew J
authors.initials: AJ
authors.lastname: Breen
authors.affiliation: 3Department of Physical Metallurgy and Materials Testing,Montanuniversität Leoben,Franz-Josef Straße 18,8700 Leoben,Austria.
authors.forename: Katharina
authors.initials: K
authors.lastname: Babinsky
authors.affiliation: 1Australian Centre for Microscopy and Microanalysis,The University of Sydney,Sydney,NSW 2006,Australia.
authors.forename: Alec C
authors.initials: AC
authors.lastname: Day
authors.affiliation: 1Australian Centre for Microscopy and Microanalysis,The University of Sydney,Sydney,NSW 2006,Australia.
authors.forename: K
authors.initials: K
authors.lastname: Eder
authors.affiliation: 1Australian Centre for Microscopy and Microanalysis,The University of Sydney,Sydney,NSW 2006,Australia.
authors.forename: Connor J
authors.initials: CJ
authors.lastname: Oakman
authors.affiliation: 1Australian Centre for Microscopy and Microanalysis,The University of Sydney,Sydney,NSW 2006,Australia.
authors.forename: Patrick W
authors.initials: PW
authors.lastname: Trimby
authors.affiliation: 4School of Materials Science and Engineering,The University of New South Wales,Sydney,NSW 2052,Australia.
authors.forename: Sophie
authors.initials: S
authors.lastname: Primig
authors.affiliation: 1Australian Centre for Microscopy and Microanalysis,The University of Sydney,Sydney,NSW 2006,Australia.
authors.forename: Julie M
authors.initials: JM
authors.lastname: Cairney
authors.affiliation: 1Australian Centre for Microscopy and Microanalysis,The University of Sydney,Sydney,NSW 2006,Australia.
authors.forename: Simon P
authors.initials: SP
authors.lastname: Ringer
keywords: atom probe tomography; crystallography; grain boundary; misorientation; transmission Kikuchi diffraction