Simulation in elemental mapping using aberration-corrected electron microscopy.
Elemental mapping at the atomic scale in aberration-corrected electron microscopes is becoming increasingly widely used. In this paper we describe the essential role of simulation in understanding the underlying physics and thus in correctly interpreting these maps, both qualitatively and quantitatively.
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia. Electronic address: lja@unimelb.edu.au.
L J
LJ
Allen
Atomic resolution imaging; Electron energy-loss spectroscopy; Elemental mapping; Energy-dispersive X-ray analysis; Energy-filtered transmission electron microscopy