Mapping of stripe rust resistance QTL in Cappelle-Desprez × PBW343 RIL population effective in northern wheat belt of India.
Stripe rust caused by Puccinia striiformis f. sp. tritici is most important and devastating disease of wheat worldwide, which affects the grain yields, quality and nutrition. To elucidate, the genetic basis of resistance, a mapping population of recombinant inbred lines was developed from a cross between resistant Cappelle-Desprez and susceptible cultivar PBW343 using single-seed descent. Variety PBW343 had been one of the most popular cultivars of North Western Plains Zone, for more than a decade, before succumbing to the stripe rust. Cappelle-Desprez, a source of durable adult plant resistance, has maintained its resistance against stripe rust for a long time in Europe. Map construction and QTL analysis were completed with 1012 polymorphic (DArT and SSR) markers. Screenings for stripe rust disease were carried out in field condition for two consecutive crop seasons (2012-2013 and 2013-2014). Susceptible parent (PBW343) achieved a significant level of disease i.e., 100 % in both the years. In present investigations, resistance in Cappelle-Desprez was found stable and response to the rust ranged from 0 to 1.5 % over the years. The estimated broad-sense heritability (h2) of stripe rust rAUDPC in the mapping population was 0.82. The relative area under the disease progress curve data showed continuous distributions, indicating that trait was controlled multigenically. Genomic region identified on chromosome 2D, was located within the short arm, with flanking markers (Xgwm484-Xcfd73), explained phenotypic variation (PVE) ranged from 13.9 to 31.8 %. The genomic region identified on chromosome 5B was found with the effect of maximum contribution with flanking DArT markers (1376633|F|0-1207571|F|0), PVE ranged from 24 to 27.0 %. This can, therefore, be utilized for marker assisted selection in developing much needed stripe rust resistant lines for the northern wheat belt of India.
Indian Institute of Wheat and Barley Research, Karnal, 132001, India.
Sushma Kumari
SK
Pawar
Indian Institute of Wheat and Barley Research, Karnal, 132001, India.
Davinder
D
Sharma
Ch. Devi Lal University, Sirsa, Haryana, 125055, India.
Joginder Singh
JS
Duhan
Indian Institute of Wheat and Barley Research, Karnal, 132001, India.
Mahender Singh
MS
Saharan
Indian Institute of Wheat and Barley Research, Karnal, 132001, India. tiwari1964@yahoo.com.
Ratan
R
Tiwari
Indian Institute of Wheat and Barley Research, Karnal, 132001, India.
Indu
I
Sharma
Adult plant resistance; DArT markers; QTL mapping; Stripe rust