Enhanced spatial resolution in vector potential photoelectron microscopy.
The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low-energy secondary photoelectron images from an aluminium-calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low-energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution.
R. Browning Consultants, Shoreham, New York, U.S.A.
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R
Browning
Materials microanalysis; VPPEM; photoelectron microscopy