title: Direct measurement of the negative Goos-Hänchen shift of single reflection in a two-dimensional photonic crystal with negative refractive index.
abstract: The negative Goos-Hänchen shift (GHS) on a two-dimensional photonic crystal with an effective negative refractive index is investigated by simulation and experiment. The measured refractive index of the fabricated photonic crystal is nearly -0.44. The difference between the Goos-Hänchen shift of the transverse electric wave GTEand that of the transverse magnetic wave GTM(DGHS) in the height direction of a silicon rod is measured at three incident angles. The result shows that DGHS is always smaller than -GTM, thus GTE<0; therefore, the negative GHS does occur on the surface of the photonic crystal with a negative refractive index.
authors.forename: Qiang
authors.initials: Q
authors.lastname: Jiang
authors.forename: Jiabi
authors.initials: J
authors.lastname: Chen
authors.forename: Binming
authors.initials: B
authors.lastname: Liang
authors.forename: Yan
authors.initials: Y
authors.lastname: Wang
authors.forename: Jinbing
authors.initials: J
authors.lastname: Hu
authors.forename: Songlin
authors.initials: S
authors.lastname: Zhuang