title: High-Resolution Adhesion Mapping of the Odd-Even Effect on a Layer-by-Layer Coated Biomaterial by Atomic-Force-Microscopy.
abstract: The adhesion behavior of polyelectrolyte multilayers consisting of poly(diallyldimethylammonium chloride), PDDA, and poly(styrenesulfonate), PSS, toward a silicon AFM tip was studied during their build-up on wood, a chemically heterogeneous, micrometer rough biomaterial and compared with a nanometer rough substrate, namely quartz. The atomic force microscopy-based force mapping approach generated high-resolution topography-, and adhesion maps within the first bilayers, which point toward a homogeneous layer-by-layer build-up on the biomaterial surface, and therefore indicate an even charge distribution. By analyzing the force-distance curves in every pixel of the mapping, new insights into the specific interactions of the polyelectrolyte multilayers at the surface were achieved. The characteristic odd-even effect of polyelectrolyte multilayers cannot only be determined on quartz, but also on the biomaterial wood, however, only after an offset of two bilayers. This is potentially due to the specific roughness and charge of wood in comparison to commonly used quartz.
authors.affiliation: Wood Materials Science, Institute for Building Materials, ETH Zürich , Stefano-Franscini-Platz 3, 8093 Zürich, Switzerland.|Applied Wood Materials, EMPA Swiss Federal Laboratories for Materials Science and Technology , Überlandstrasse 129, 8600 Dübendorf, Switzerland.
authors.forename: Kirstin
authors.identifier: http://orcid.org/0000-0002-0431-9313
authors.initials: K
authors.lastname: Casdorff
authors.affiliation: Wood Materials Science, Institute for Building Materials, ETH Zürich , Stefano-Franscini-Platz 3, 8093 Zürich, Switzerland.|Applied Wood Materials, EMPA Swiss Federal Laboratories for Materials Science and Technology , Überlandstrasse 129, 8600 Dübendorf, Switzerland.
authors.forename: Tobias
authors.initials: T
authors.lastname: Keplinger
authors.affiliation: Wood Materials Science, Institute for Building Materials, ETH Zürich , Stefano-Franscini-Platz 3, 8093 Zürich, Switzerland.|Applied Wood Materials, EMPA Swiss Federal Laboratories for Materials Science and Technology , Überlandstrasse 129, 8600 Dübendorf, Switzerland.
authors.forename: Hervé
authors.initials: H
authors.lastname: Bellanger
authors.affiliation: Wood Materials Science, Institute for Building Materials, ETH Zürich , Stefano-Franscini-Platz 3, 8093 Zürich, Switzerland.|Applied Wood Materials, EMPA Swiss Federal Laboratories for Materials Science and Technology , Überlandstrasse 129, 8600 Dübendorf, Switzerland.
authors.forename: Benjamin
authors.initials: B
authors.lastname: Michen
authors.affiliation: FIRST Laboratory, ETH Zürich , 8093 Zürich, Switzerland.
authors.forename: Silke
authors.initials: S
authors.lastname: Schön
authors.affiliation: Wood Materials Science, Institute for Building Materials, ETH Zürich , Stefano-Franscini-Platz 3, 8093 Zürich, Switzerland.|Applied Wood Materials, EMPA Swiss Federal Laboratories for Materials Science and Technology , Überlandstrasse 129, 8600 Dübendorf, Switzerland.
authors.forename: Ingo
authors.initials: I
authors.lastname: Burgert
keywords: AFM; LbL; quantitative imaging; quartz; wood