title: Field modeling and ray-tracing of a miniature scanning electron microscope beam column.
abstract: A miniature scanning electron microscope (SEM) focusing column design is introduced and its potential performance assessed through an estimation of parameters that affect the probe radius, to include source size, spherical and chromatic aberration, diffraction and space charge broadening. The focusing column, a critical component of any SEM capable of operating on the lunar surface, was developed by the NASA Marshall Space Flight Center and Advanced Research Systems. The ray-trace analysis presented uses a model of the electrostatic field (within the focusing column) that is first calculated using the boundary element method (BEM). This method provides flexibility in modeling the complex electrode shapes of practical electron lens systems. A Fourier series solution of the lens field is then derived within a cylindrical domain whose boundary potential is provided by the BEM. Used in this way, the Fourier series solution is an accuracy enhancement to the BEM solution, allowing sufficient precision to assess geometric aberrations through direct ray-tracing. Two modes of operation with distinct lens field solutions are described.
authors.affiliation: Simulation Technologies, Huntsville, AL 35805,USA.
authors.forename: Jody S
authors.initials: JS
authors.lastname: Loyd
authors.affiliation: The University of Alabama in Huntsville, Huntsville, AL 35899, USA.
authors.forename: Don A
authors.initials: DA
authors.lastname: Gregory
authors.affiliation: NASA Marshall Space Flight Center, Huntsville, AL 35812, USA.
authors.forename: Jessica A
authors.initials: JA
authors.lastname: Gaskin
keywords: aberrations; electron optics; scanning electron microscopy