title: Reducing mass peak instability caused by the phase changes of RF and AC signals in a rectilinear ion-trap analyzer.
abstract: For an ion trap with resonance ejection, peak intensity and peak position of the acquired mass spectra are affected by the phase difference between the radio frequency (RF) and auxiliary alternating current (AC) potentials. To ensure measurement stability, RF and AC phase-locking is commonly used in commercial ion trap mass spectrometers. In this study, a compact electronic control system was developed to accurately regulate the RF and AC phases and was employed in a photoionization rectilinear ion trap (RIT) mass spectrometer. We found that the phase-locking method was defective in multicomponent analysis because the optimal RF and AC phase difference was usually different for different m/z peaks. After studying and characterizing the relationship between the peaks and the RF and AC phases, a correction method based on data processing was used to improve the peaks' stability and accuracy. The results show that the fluctuations of both peak intensity and peak position were significantly reduced and that the instrument presented satisfying reproducibility and quantitative ability.
authors.affiliation: Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China.
authors.forename: Xinqiong
authors.identifier: 000000032999120X
authors.initials: X
authors.lastname: Lu
authors.affiliation: Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China.
authors.forename: Kai
authors.initials: K
authors.lastname: Ni
authors.affiliation: Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China.
authors.forename: Quan
authors.initials: Q
authors.lastname: Yu
authors.affiliation: Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China.
authors.forename: Wenchao
authors.initials: W
authors.lastname: Xu
authors.affiliation: Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China.
authors.forename: Xiang
authors.initials: X
authors.lastname: Qian
authors.affiliation: Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China.
authors.forename: Xiaohao
authors.initials: X
authors.lastname: Wang