title: Twin domain imaging in topological insulator Bi2Te3and Bi2Se3epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction.
abstract: The twin distribution in topological insulators Bi2Te3and Bi2Se3was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by 60°. The bulk crystal orientation is mapped out using SXRM by measuring the diffracted X-ray intensity of an asymmetric Bragg peak using a nano-focused X-ray beam scanned over the sample. By comparing bulk- and surface-sensitive measurements of the same area, buried twin domains not visible on the surface are identified. The lateral twin domain size is found to increase with the film thickness.
authors.affiliation: Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2, Czech Republic.
authors.forename: Dominik
authors.identifier: https://orcid.org/0000-0001-6961-6581
authors.initials: D
authors.lastname: Kriegner
authors.affiliation: Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2, Czech Republic.
authors.forename: Petr
authors.initials: P
authors.lastname: Harcuba
authors.affiliation: Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2, Czech Republic.
authors.forename: Jozef
authors.initials: J
authors.lastname: Veselý
authors.affiliation: Institut für Experimentelle Physik, Otto-von-Guericke Universität Magdeburg, Universitätsplatz 2, 39106 Magdeburg, Germany.
authors.forename: Andreas
authors.initials: A
authors.lastname: Lesnik
authors.affiliation: Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz, Altenbergerstrasse 69, 4040 Linz, Austria.
authors.forename: Guenther
authors.initials: G
authors.lastname: Bauer
authors.affiliation: Institute of Semiconductor and Solid State Physics, Johannes Kepler University Linz, Altenbergerstrasse 69, 4040 Linz, Austria.
authors.forename: Gunther
authors.initials: G
authors.lastname: Springholz
authors.affiliation: Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 121 16 Prague 2, Czech Republic.
authors.forename: Václav
authors.initials: V
authors.lastname: Holý
keywords: electron backscatter diffraction; scanning X-ray diffraction; topological insulators; twinning