title: Imaging of a Thin Oxide Film Formation from the Combination of Surface Reflectivity and Electrochemical Methods.
abstract: Electrochemical methods (cyclic voltammetry (CV), potential steps, and electrochemical impedance spectroscopy) were successfully combined with in situ reflectometry measurements for a detailed analysis of the passive layer evolution as a function of the electrode potential. Interestingly, both EIS and surface reflectivity allowed a film thickness in the nanometer range to be readily determined. In addition, transient analyses of the reflectivity simultaneously recorded with CVs show the formation of both Fe2O3and Fe3O4oxides. The image analysis showed that the steel surface reactivity is heterogeneous and presents micrometric islands coated with a thicker oxide layer than the surrounding surface. The in situ combination of these techniques thus offers a powerful analytical description of the interface on a local scale and its transient response to a perturbation.
authors.affiliation: Sorbonne Universités, UPMC Univ Paris 06, CNRS, Laboratoire Interfaces et Systèmes Electrochimiques, 4 place Jussieu, F-75005, Paris, France.
authors.forename: Sara
authors.initials: S
authors.lastname: Chakri
authors.affiliation: Sorbonne Paris Cité, Paris Diderot University, Interfaces, Traitements, Organisation et Dynamique des Systèmes Laboratory, CNRS-UMR 7086, 15 rue J. A. Baif, 75013 Paris, France.
authors.forename: Anisha N
authors.identifier: 0000-0002-4914-5062
authors.initials: AN
authors.lastname: Patel
authors.affiliation: Sorbonne Universités, UPMC Univ Paris 06, CNRS, Laboratoire Interfaces et Systèmes Electrochimiques, 4 place Jussieu, F-75005, Paris, France.
authors.forename: Isabelle
authors.initials: I
authors.lastname: Frateur
authors.affiliation: Sorbonne Paris Cité, Paris Diderot University, Interfaces, Traitements, Organisation et Dynamique des Systèmes Laboratory, CNRS-UMR 7086, 15 rue J. A. Baif, 75013 Paris, France.
authors.forename: Frédéric
authors.identifier: 0000-0002-9784-2380
authors.initials: F
authors.lastname: Kanoufi
authors.affiliation: Sorbonne Universités, UPMC Univ Paris 06, CNRS, Laboratoire Interfaces et Systèmes Electrochimiques, 4 place Jussieu, F-75005, Paris, France.
authors.forename: Eliane M M
authors.initials: EMM
authors.lastname: Sutter
authors.affiliation: Sorbonne Universités, UPMC Univ Paris 06, CNRS, Laboratoire Interfaces et Systèmes Electrochimiques, 4 place Jussieu, F-75005, Paris, France.
authors.forename: T T Mai
authors.initials: TTM
authors.lastname: Tran
authors.affiliation: Sorbonne Universités, UPMC Univ Paris 06, CNRS, Laboratoire Interfaces et Systèmes Electrochimiques, 4 place Jussieu, F-75005, Paris, France.
authors.forename: Bernard
authors.initials: B
authors.lastname: Tribollet
authors.affiliation: Sorbonne Universités, UPMC Univ Paris 06, CNRS, Laboratoire Interfaces et Systèmes Electrochimiques, 4 place Jussieu, F-75005, Paris, France.
authors.forename: Vincent
authors.identifier: 0000-0001-5424-0083
authors.initials: V
authors.lastname: Vivier