title: Optical properties of Cu2ZnSnSe4thin films and identification of secondary phases by spectroscopic ellipsometry.
abstract: We apply spectroscopic ellipsometry (SE) to identify secondary phases in Cu2ZnSnSe4(CZTSe) absorbers and to investigate the optical properties of CZTSe. A detailed optical model is used to extract the optical parameters, such as refractive index and extinction coefficient in order to extrapolate the band gap values of CZTSe samples, and to obtain information about the presence of secondary phases at the front and back sides of the samples. We show that SE can be used as a non-destructive method for detection of the secondary phases ZnSe and MoSe2and to extrapolate the band gap values of CZTSe phase.
authors.forename: Özden
authors.initials: Ö
authors.lastname: Demircioğlu
authors.forename: José Fabio López
authors.initials: JF
authors.lastname: Salas
authors.forename: Germain
authors.initials: G
authors.lastname: Rey
authors.forename: Thomas
authors.initials: T
authors.lastname: Weiss
authors.forename: Marina
authors.initials: M
authors.lastname: Mousel
authors.forename: Alex
authors.initials: A
authors.lastname: Redinger
authors.forename: Susanne
authors.initials: S
authors.lastname: Siebentritt
authors.forename: Jürgen
authors.initials: J
authors.lastname: Parisi
authors.forename: Levent
authors.initials: L
authors.lastname: Gütay