title: STUDYING THE STRUCTURAL, OPTICAL, CHEMICAL AND ELECTROCHEMICAL ETCHING CHANGES OF CR-39 FOR DOSEMETRIC APPLICATIONS.
abstract: The present work shows the induced modification of the structural, optical, chemical etching and electrochemical etching parameters of CR-39 irradiated with alpha-particles. CR-39 polymer track detectors were irradiated with different fluences (1.62 × 106, 2.72 × 106, 3.82 × 106 and 5.21 × 106 particles/cm2) of alpha-particles using 241Am source. The structural and optical properties were measured by FT-IR spectroscopy, X-ray diffraction and UV/Vis spectroscopy, respectively. The FT-IR spectra reveal that no major changes in the typical functional groups of irradiated polymer detectors. The X-ray diffraction patterns show that a broad band in the region of 12° < 2θ > 27°, which refers to the presence of the combination of amorphous and crystalline phases. UV/Vis responses of irradiated polymer track detectors exhibit a single absorption band in the range of 254-352 nm that is correlated to the occurrence of electronic transition. Also, the changes in the chemical and electrochemical parameters due to alpha-irradiation are examined and thoroughly discussed.
authors.affiliation: Experimental Nuclear Physics Department, Nuclear Research Center, Atomic Energy Authority, PO 13759, Abu Zaabal, Cairo, Egypt.
authors.forename: M F
authors.initials: MF
authors.lastname: Zaki
authors.affiliation: Reactor Physics Department, Nuclear Research Center, Atomic Energy Authority (AEA), Cairo, Egypt.
authors.forename: Y H
authors.initials: YH
authors.lastname: Elshaer
authors.affiliation: Physics Department, University College for Girls, Ain Shams University, Cairo, Egypt.
authors.forename: Doaa H
authors.initials: DH
authors.lastname: Taha
mesh_terms: D000512:Alpha Particles; D000576:Americium; D015394:Molecular Structure; D055620:Optical Phenomena; D011092:Polyethylene Glycols / Q000737:chemistry*; D013056:Spectrophotometry, Ultraviolet; D017550:Spectroscopy, Fourier Transform Infrared; D014961:X-Ray Diffraction
chemical_list: C028827:CR 39; D011092:Polyethylene Glycols; C000615192:Americium-241; D000576:Americium