Draft Genome Sequence of Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm
Genomic DNA of X. fastidiosa strain ATCC35873 was extracted from a pure culture grown in periwinkle wilt medium (7), using the Blood and Tissue kit (Qiagen Inc., Valencia, CA) according to the manufacturers instructions. Random shotgun and 3-kb mate-pair libraries of ATCC35873 were generated and sequenced using Roche 454 GS (FLX titanium)